Applied Materials Opal 7830 i Critical Dimension – Scanning Electron Microscopy (CD SEM)

Asset # : 65926
Equipment Make: Applied Materials
Equipment Model: Opal 7830 i
Type: Critical Dimension - Scanning Electron Microscopy (CD-SEM)
Wafer Size:
Equipment Configuration:

Does not include:
– Loading platform / robot
– External pumps

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Ad Details

  • Added: June 15, 2022

  • Views: 14

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