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25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 130687 |
|
ONTO / Nanometrics / Accent / Bio-Rad QS 2200 A FTIR Spectrometer (Fourier Transform Infrared) |
ONTO / Nanometrics / Accent / Bio-Rad | QS 2200 A | FTIR Spectrometer (Fourier Transform Infrared) | - |
| 130685 |
Sold
|
KLA Surfscan 6420 Particle Defect System |
KLA | Surfscan 6420 | Particle Defect System | 6, 8 inch |
| 130683 |
Sold
|
Applied Materials P 5000 Mark II System |
Applied Materials | P 5000 Mark II | System | 8 inch |
| 130681 |
|
Axcelis NV 8250 HT Ion Implanter |
Axcelis | NV 8250 HT | Ion Implanter | 8 inch |
| 130669 |
|
Axcelis NV GSD 200 E 2 Ion Implanter |
Axcelis | NV GSD 200 E 2 | Ion Implanter | 8 inch |
| 130656 |
|
KLA Puma 9130 Darkfield Defect Inspection System |
KLA | Puma 9130 | Darkfield Defect Inspection System | - |
| 130655 |
|
KLA Puma 9120 Darkfield Defect Inspection System |
KLA | Puma 9120 | Darkfield Defect Inspection System | 8, 12 inch |
| 130663 |
|
KLA P 12 Stylus Profilometer |
KLA | P 12 | Stylus Profilometer | - |
| 130654 |
|
KLA AIT UV Darkfield Defect Inspection |
KLA | AIT UV | Darkfield Defect Inspection | - |
| 130653 |
|
Hitachi S 9380 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 130652 |
|
Hitachi S 5500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 130651 |
|
Hitachi S 5200 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5200 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 130650 |
|
Applied Materials G 5 SEM Review (Scanning Electron Microscope) |
Applied Materials | G 5 | SEM Review (Scanning Electron Microscope) | - |
| 130649 |
|
Applied Materials GX SEM Review (Scanning Electron Microscope) |
Applied Materials | GX | SEM Review (Scanning Electron Microscope) | - |
| 130648 |
|
Applied Materials G 3 Lite SEM Review (Scanning Electron Microscope) |
Applied Materials | G 3 Lite | SEM Review (Scanning Electron Microscope) | - |
| 130647 |
|
Applied Materials G 2 SEM (Scanning Electron Microscope) |
Applied Materials | G 2 | SEM (Scanning Electron Microscope) | - |
| 130646 |
|
Applied Materials CX 300 SEM Review (Scanning Electron Microscope) |
Applied Materials | CX 300 | SEM Review (Scanning Electron Microscope) | - |
| 130645 |
|
Applied Materials CX 200 SEM Review (Scanning Electron Microscope) |
Applied Materials | CX 200 | SEM Review (Scanning Electron Microscope) | - |
| 130644 |
|
Applied Materials Complus 4 T Darkfield Defect Inspection System |
Applied Materials | Complus 4 T | Darkfield Defect Inspection System | 12 inch |
| 130639 |
|
STS Multiplex ICP-DRIE (Inductively Coupled Plasma – Deep Reactive Ion Etcher) |
STS | Multiplex | ICP-DRIE (Inductively Coupled Plasma – Deep Reactive Ion Etcher) | - |
| 130635 |
|
Nikon Optiphot 150 Microscope |
Nikon | Optiphot 150 | Microscope | - |
| 130637 |
|
Electroglas EG 4090 u DD Interface |
Electroglas | EG 4090 u | DD Interface | - |
| 130636 |
|
Nikon Optiphot 200 Microscope |
Nikon | Optiphot 200 | Microscope | - |
| 130633 |
|
Nikon Optiphot 100 Microscope |
Nikon | Optiphot 100 | Microscope | - |
| 130634 |
Sold
|
Multitest MT 9510 XP Handler |
Multitest | MT 9510 XP | Handler | - |
| 130632 |
Sold
|
Electroglas EG 4090 u + Prober |
Electroglas | EG 4090 u + | Prober | - |
| 130631 |
|
Nikon NWL 860 Wafer Loader |
Nikon | NWL 860 | Wafer Loader | 6, 8 inch |
| 130625 |
Sold
|
LTX / Credence X-Series LX 20 ATE Tester |
LTX / Credence | X-Series LX 20 | ATE Tester | - |
| 130611 |
|
Tel Vigus ATCC Etcher |
Tel | Vigus ATCC | Etcher | 12 inch |
| 130610 |
|
Tel Unity II E 855 SS Etcher |
Tel | Unity II E 855 SS | Etcher | 8 inch |
| 130609 |
|
Tel Unity II E 855 DD Etcher |
Tel | Unity II E 855 DD | Etcher | 8 inch |
| 130608 |
|
Tel Unity 2 855 PP Etcher |
Tel | Unity 2 855 PP | Etcher | 8 inch |
| 130607 |
|
Tel Unity M 8555 DDD Etcher |
Tel | Unity M 8555 DDD | Etcher | 8 inch |
| 130606 |
|
Tel Telius SP Shin Etcher |
Tel | Telius SP Shin | Etcher | 12 inch |
| 130605 |
|
Tel Telius SP SE Etcher |
Tel | Telius SP SE | Etcher | 12 inch |
| 130604 |
|
Tel Telius SP Jin Etcher |
Tel | Telius SP Jin | Etcher | 12 inch |
| 130603 |
|
Tel Telius 3055 DD Etcher |
Tel | Telius 3055 DD | Etcher | 12 inch |
| 130602 |
|
Tel Alpha 303 i Furnace |
Tel | Alpha 303 i | Furnace | 12 inch |
| 130601 |
|
Prometrix RS 55 TCA |
Prometrix | RS 55 TCA | - | - |
| 130600 |
|
Ontrak DSS 200 Series II |
Ontrak | DSS 200 Series II | - | 8 inch |
| 130599 |
|
Olympus MX 61 Microscope |
Olympus | MX 61 | Microscope | 8, 12 inch |
| 130598 |
|
Lam / Novellus / Gasonics Gamma 2130 Asher |
Lam / Novellus / Gasonics | Gamma 2130 | Asher | 12 inch |
| 130597 |
|
Lam / Novellus Concept Three Speed CVD (Chemical Vapor Deposition) |
Lam / Novellus | Concept Three Speed | CVD (Chemical Vapor Deposition) | 12 inch |
| 130596 |
|
Lam / Novellus Concept Two Speed HDP-CVD (High-Density Plasma - Chemical Vapor Deposition) |
Lam / Novellus | Concept Two Speed | HDP-CVD (High-Density Plasma - Chemical Vapor Deposition) | 8 inch |
| 130595 |
|
Lam / Novellus Concept Two Sequel PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Lam / Novellus | Concept Two Sequel | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 8 inch |
| 130594 |
|
Lam / Novellus Concept Two Altus Shrink CVD (Chemical Vapor Deposition) |
Lam / Novellus | Concept Two Altus Shrink | CVD (Chemical Vapor Deposition) | 8 inch |
| 130593 |
|
ONTO / Nanometrics 8300 XSE |
ONTO / Nanometrics | 8300 XSE | - | 8, 12 inch |
| 130592 |
|
N&K Technology 1512 |
N&K Technology | 1512 | - | 12 inch |