English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 130775 |
|
Axcelis GSD 100 Implanter |
Axcelis | GSD 100 | Implanter | 6 inch |
| 130774 |
|
Amaya A 6300 S CVD (Chemical Vapor Deposition) |
Amaya | A 6300 S | CVD (Chemical Vapor Deposition) | 6 inch |
| 130771 |
|
KLA Surfscan SP 2 Particle Defect System |
KLA | Surfscan SP 2 | Particle Defect System | 12 inch |
| 130770 |
|
Esec 2100 XP Die Bonder |
Esec | 2100 XP | Die Bonder | - |
| 130767 |
|
Bruker Contour GT X 3D Interferometric Microscope |
Bruker | Contour GT X | 3D Interferometric Microscope | 8 inch |
| 130769 |
|
Semitool Cintillio SAT (Spray Acid Tool) |
Semitool | Cintillio | SAT (Spray Acid Tool) | - |
| 130768 |
|
RPS Vector 460 Select Solder Machine |
RPS | Vector 460 | Select Solder Machine | - |
| 130762 |
Sold
|
Mattson Aspen II Asher |
Mattson | Aspen II | Asher | - |
| 130752 |
|
Shincron 850 DDI |
Shincron | 850 DDI | - | - |
| 130751 |
|
Veeco RF 16 cm Ion Source Body |
Veeco | RF 16 cm | Ion Source Body | - |
| 130750 |
|
AE PE II 10 K |
AE | PE II 10 K | - | - |
| 130749 |
|
AE Pinnacle |
AE | Pinnacle | - | - |
| 130748 |
|
Ion Tech RF 2051 DC Bias |
Ion Tech | RF 2051 | DC Bias | - |
| 130747 |
|
AE RF Controller |
AE | - | RF Controller | - |
| 130746 |
|
AE AM 5 RF Matching Network |
AE | AM 5 | RF Matching Network | - |
| 130745 |
|
Veeco RF Matching Assembly |
Veeco | - | RF Matching Assembly | - |
| 130744 |
|
Rasco Saturn Handler |
Rasco | Saturn | Handler | - |
| 130743 |
Sold
|
Disco DAG 810 Back Grinder |
Disco | DAG 810 | Back Grinder | 8 inch |
| 130742 |
|
LTX / Credence MX |
LTX / Credence | MX | - | - |
| 130741 |
|
Electroglas EG 4090 Automatic Wafer Prober |
Electroglas | EG 4090 | Automatic Wafer Prober | - |
| 130740 |
|
Electroglas EG 4060 Prober |
Electroglas | EG 4060 | Prober | - |
| 130739 |
|
Electroglas EG 4080 Prober |
Electroglas | EG 4080 | Prober | - |
| 130736 |
|
Novellus / Varian 3290 STQ Sputtering System |
Novellus / Varian | 3290 STQ | Sputtering System | - |
| 130733 |
Sold
|
Axcelis NV GSD 200 Implanter |
Axcelis | NV GSD 200 | Implanter | - |
| 130728 |
|
Applied Materials P 5000 Mark II Etcher |
Applied Materials | P 5000 Mark II | Etcher | 8 inch |
| 130727 |
|
Applied Materials P 5000 Mark II PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Applied Materials | P 5000 Mark II | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 8 inch |
| 130726 |
|
Applied Materials P 5000 Mark II PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Applied Materials | P 5000 Mark II | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 8 inch |
| 130725 |
|
Applied Materials P 5000 Mark II PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Applied Materials | P 5000 Mark II | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 8 inch |
| 130711 |
|
Ulvac EBX 8 C Evaporator |
Ulvac | EBX 8 C | Evaporator | - |
| 130710 |
|
Ulvac EBX 10 C High Vacuum Evaporation System |
Ulvac | EBX 10 C | High Vacuum Evaporation System | - |
| 130709 |
|
Ulvac EBX 2000 High Vacuum Evaporation System |
Ulvac | EBX 2000 | High Vacuum Evaporation System | - |
| 130707 |
|
KLA P 17 Surface Profilometer |
KLA | P 17 | Surface Profilometer | 12, 4, 6, 8 inch |
| 130706 |
|
KLA RS 100 Sheet Resistance Measurement System |
KLA | RS 100 | Sheet Resistance Measurement System | 12, 4, 6, 8 inch |
| 130705 |
|
ONTO / Rudolph MP 300 Metal Film Thickness |
ONTO / Rudolph | MP 300 | Metal Film Thickness | 12, 4, 6, 8 inch |
| 130704 |
|
KLA 2320 Stress Measurement |
KLA | 2320 | Stress Measurement | 12, 4, 6, 8 inch |
| 130703 |
|
Nikon 3200 Automatic Microscope |
Nikon | 3200 | Automatic Microscope | 12 inch |
| 130702 |
|
KLA Surfscan SP 1 Particle Defect System |
KLA | Surfscan SP 1 | Particle Defect System | 12 inch |
| 130701 |
|
KLA Surfscan 6200 Particle Defect System |
KLA | Surfscan 6200 | Particle Defect System | 8 inch |
| 130700 |
|
KLA Quantox 64000 Monitoring System |
KLA | Quantox 64000 | Monitoring System | 12 inch |
| 130699 |
|
KLA Quantox XP In-Line Electrical Monitoring and Characterization System |
KLA | Quantox XP | In-Line Electrical Monitoring and Characterization System | 12 inch |
| 130698 |
|
KLA 2351 Inspection System |
KLA | 2351 | Inspection System | 12, 8 inch |
| 130661 |
|
KLA 2135 Brightfield Inspection |
KLA | 2135 | Brightfield Inspection | - |
| 130660 |
|
KLA FX 200 Film Thickness Measurement System |
KLA | FX 200 | Film Thickness Measurement System | 12 inch |
| 130659 |
|
KLA Archer 300 Overlay System |
KLA | Archer 300 | Overlay System | 12 inch |
| 130658 |
|
KLA Archer 200 Overlay System |
KLA | Archer 200 | Overlay System | 12 inch |
| 130657 |
|
KLA Archer 100 Overlay System |
KLA | Archer 100 | Overlay System | 12 inch |
| 130692 |
|
Accretech / TSK UF 200 R Prober |
Accretech / TSK | UF 200 R | Prober | - |
| 130691 |
|
KLA / Therma-wave OP 5220 Film Thickness Measurement |
KLA / Therma-wave | OP 5220 | Film Thickness Measurement | - |