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of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 130501 |
|
Mattson Aspen II Asher |
Mattson | Aspen II | Asher | 6 inch |
| 130496 |
Sold
|
EVG 510 Bonder |
EVG | 510 | Bonder | - |
| 130492 |
|
Denton Explorer 14 Sputtering System |
Denton | Explorer 14 | Sputtering System | - |
| 130490 |
Sold
|
Disco DFD 6361 Automatic Dicing Saw |
Disco | DFD 6361 | Automatic Dicing Saw | - |
| 130485 |
|
Hitachi S 9380 SEM (Scanning Electron Microscope) |
Hitachi | S 9380 | SEM (Scanning Electron Microscope) | - |
| 130481 |
Sold
|
KLA Surfscan SP 2 |
KLA | Surfscan SP 2 | - | 8, 12 inch |
| 130465 |
|
Nikon NSR 2205 i 8 A i-Line Stepper |
Nikon | NSR 2205 i 8 A | i-Line Stepper | 6 inch |
| 130463 |
|
Nikon NSR 2205 i 11 D i-Line Stepper |
Nikon | NSR 2205 i 11 D | i-Line Stepper | 8 inch |
| 130450 |
|
Applied Materials Centura 5200 PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Applied Materials | Centura 5200 | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 8 inch |
| 130449 |
|
Ferrotec / Temescal UEFC 4900 Evaporator |
Ferrotec / Temescal | UEFC 4900 | Evaporator | - |
| 130448 |
|
KLA Candela CS 920 Surface Analyzer |
KLA | Candela CS 920 | Surface Analyzer | 6, 8 inch |
| 130447 |
|
SSI Solaris 200 RTA (Rapid Thermal Annealing) |
SSI | Solaris 200 | RTA (Rapid Thermal Annealing) | - |
| 130446 |
|
X-CelePrint MTP 1003 Manual UTP System |
X-CelePrint | MTP 1003 | Manual UTP System | - |
| 130445 |
Sold
|
ONTO / Nanometrics RPM Blue |
ONTO / Nanometrics | RPM Blue | - | - |
| 130444 |
Sold
|
Malvern Panalytical X'Pert 3 MRD XL XRD (X-ray Diffractometer) |
Malvern Panalytical | X'Pert 3 MRD XL | XRD (X-ray Diffractometer) | - |
| 130443 |
|
JST SA 0033 R 0 Wet Bench |
JST | SA 0033 R 0 | Wet Bench | - |
| 130439 |
|
Axcelis 200 PCU Photoresist Stabilizer |
Axcelis | 200 PCU | Photoresist Stabilizer | - |
| 130438 |
|
Axcelis 200 PCU Photoresist Stabilizer |
Axcelis | 200 PCU | Photoresist Stabilizer | - |
| 130437 |
|
Accretech / TSK UF 3000 EX Automatic Wafer Prober |
Accretech / TSK | UF 3000 EX | Automatic Wafer Prober | - |
| 130436 |
|
Rigaku V 300 |
Rigaku | V 300 | - | - |
| 130435 |
|
KLA HRP 240 |
KLA | HRP 240 | - | - |
| 130434 |
|
Hitachi SU 8040 |
Hitachi | SU 8040 | - | - |
| 130423 |
|
LTX / Credence D 10 Tester |
LTX / Credence | D 10 | Tester | - |
| 130422 |
|
Logitech PM 5 C Lapper |
Logitech | PM 5 C | Lapper | - |
| 130421 |
|
Yes 450 PB 6-2 P-CP Polyimide Bake Oven |
Yes | 450 PB 6-2 P-CP | Polyimide Bake Oven | - |
| 130419 |
|
Teradyne J 750 Atomic Test Equipment (ATE) |
Teradyne | J 750 | Atomic Test Equipment (ATE) | - |
| 130418 |
|
Teradyne MicroFlex LSI / IC Tester |
Teradyne | MicroFlex | LSI / IC Tester | - |
| 130417 |
|
Tel P 8 Prober |
Tel | P 8 | Prober | - |
| 130416 |
|
Applied Materials 5500 / 100 D Stepper / Scanner |
Applied Materials | 5500 / 100 D | Stepper / Scanner | - |
| 130404 |
|
Tel Act 8 Coater / Developer |
Tel | Act 8 | Coater / Developer | - |
| 130403 |
|
Tel Mark Vz Coater / Developer |
Tel | Mark Vz | Coater / Developer | - |
| 130402 |
Sold
|
KLA Surfscan SP 1 TBI Particle Defect System |
KLA | Surfscan SP 1 TBI | Particle Defect System | 8 inch |
| 130399 |
|
SCREEN / DNS VM 2210 Inspection / Measurement |
SCREEN / DNS | VM 2210 | Inspection / Measurement | - |
| 130398 |
|
TOK TCA 3822 Asher / Stripper |
TOK | TCA 3822 | Asher / Stripper | - |
| 130397 |
|
Horiuchi MSEA 601 S S 001 Bonder |
Horiuchi | MSEA 601 S S 001 | Bonder | - |
| 130396 |
|
Disco DFD 6340 Automatic Dicing Saw |
Disco | DFD 6340 | Automatic Dicing Saw | - |
| 130395 |
|
Disco DFD 6341 Automatic Dicing Saw |
Disco | DFD 6341 | Automatic Dicing Saw | - |
| 130394 |
|
Teradyne Ultra Flex DC LSI / IC Tester |
Teradyne | Ultra Flex DC | LSI / IC Tester | - |
| 130393 |
|
Tel Lithius Coater / Developer |
Tel | Lithius | Coater / Developer | - |
| 130392 |
|
SCREEN / DNS RF 300 A Coater / Developer |
SCREEN / DNS | RF 300 A | Coater / Developer | - |
| 130391 |
|
Canon FPA 5500 iZa Stepper / Scanner |
Canon | FPA 5500 iZa | Stepper / Scanner | - |
| 130400 |
|
Zygo Verifire XP/D Laser Interferometer |
Zygo | Verifire XP/D | Laser Interferometer | - |
| 130390 |
|
Advantest T 6577 LSI / IC Tester |
Advantest | T 6577 | LSI / IC Tester | - |
| 130389 |
|
Accretech / TSK UF 3000 Automatic Wafer Prober |
Accretech / TSK | UF 3000 | Automatic Wafer Prober | - |
| 130380 |
|
KLA 5200 XP Overlay Measurement |
KLA | 5200 XP | Overlay Measurement | 4, 6, 8 inch |
| 130386 |
|
4Dimensions 280 Probe Meter |
4Dimensions | 280 | Probe Meter | - |
| 130378 |
|
KLA 5200 XP Overlay Measurement |
KLA | 5200 XP | Overlay Measurement | 4, 6, 8 inch |
| 130371 |
|
Electronic Visions EV 620 |
Electronic Visions | EV 620 | - | - |