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25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 73313 |
Sold
|
KLA / Filmetrics F 5 X Film Thickness Measurement |
KLA / Filmetrics | F 5 X | Film Thickness Measurement | - |
| 73312 |
|
KLA Archer 500 Overlay Metrology System |
KLA | Archer 500 | Overlay Metrology System | - |
| 73311 |
|
KLA Archer 300 PL Metrology System |
KLA | Archer 300 PL | Metrology System | - |
| 73310 |
|
KLA Archer 300 Overlay System |
KLA | Archer 300 | Overlay System | - |
| 73309 |
|
KLA A 500 Profilometer |
KLA | A 500 | Profilometer | - |
| 73308 |
|
KLA 2830 Wafer Inspection System |
KLA | 2830 | Wafer Inspection System | - |
| 73307 |
|
KLA 2820 Inspection |
KLA | 2820 | Inspection | - |
| 73306 |
|
Keysight / Agilent 4072 B Tester |
Keysight / Agilent | 4072 B | Tester | - |
| 73305 |
|
Keysight / Agilent 4073 B Tester |
Keysight / Agilent | 4073 B | Tester | - |
| 73304 |
|
Keysight / Agilent 4072 F Tester |
Keysight / Agilent | 4072 F | Tester | - |
| 73303 |
|
Keysight / Agilent 4072 B Tester |
Keysight / Agilent | 4072 B | Tester | - |
| 73302 |
|
Hita CG 4000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hita | CG 4000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 73301 |
|
Hike RMD Wet Process |
Hike | RMD | Wet Process | - |
| 73300 |
|
Hike QULN Diffusion Process |
Hike | QULN | Diffusion Process | - |
| 73299 |
Sold
|
Esec DB 2100 HS Die Bonder |
Esec | DB 2100 HS | Die Bonder | - |
| 73298 |
|
Hike QLV 2 Diffusion Process |
Hike | QLV 2 | Diffusion Process | - |
| 73297 |
|
Hike QL Diffusion Process |
Hike | QL | Diffusion Process | - |
| 73296 |
|
Hike Q 2 LV Diffusion Process |
Hike | Q 2 LV | Diffusion Process | - |
| 73295 |
|
Hike Q 2 LN Diffusion Process |
Hike | Q 2 LN | Diffusion Process | - |
| 73294 |
|
Hike Q 2 Diffusion Process |
Hike | Q 2 | Diffusion Process | - |
| 73293 |
|
ESI 9850 Prober |
ESI | 9850 | Prober | - |
| 73292 |
|
Ebara 300 XG 3 CMP (Chemical Mechanical Polisher) |
Ebara | 300 XG 3 | CMP (Chemical Mechanical Polisher) | - |
| 73291 |
|
Ebara 300 SG 3 CMP (Chemical Mechanical Polisher) |
Ebara | 300 SG 3 | CMP (Chemical Mechanical Polisher) | - |
| 73290 |
|
Ebara 300 S 2 G 3 CMP (Chemical Mechanical Polisher) |
Ebara | 300 S 2 G 3 | CMP (Chemical Mechanical Polisher) | - |
| 73289 |
|
SCREEN / DNS SU 31 Wet Process |
SCREEN / DNS | SU 31 | Wet Process | - |
| 73288 |
|
SCREEN / DNS SS 30 Wet Process |
SCREEN / DNS | SS 30 | Wet Process | - |
| 73287 |
|
SCREEN / DNS MP 30 Wet Process |
SCREEN / DNS | MP 30 | Wet Process | - |
| 73286 |
|
SCREEN / DNS FC 30 Wet Process |
SCREEN / DNS | FC 30 | Wet Process | - |
| 73285 |
|
Despatch LCD 1-51 N Oven |
Despatch | LCD 1-51 N | Oven | - |
| 73284 |
|
Cascade Microtech S 300 Probe Bench Station |
Cascade Microtech | S 300 | Probe Bench Station | - |
| 73283 |
|
Canon 60 ES 6 A |
Canon | 60 ES 6 A | - | - |
| 73282 |
|
Canon 5500 iZA Stepper |
Canon | 5500 iZA | Stepper | - |
| 73281 |
|
Bruker / Veeco DAFP AFM Probe (Atomic Force Microscope) |
Bruker / Veeco | DAFP | AFM Probe (Atomic Force Microscope) | - |
| 73280 |
|
Brooks MTX 4000 Wafer Sorter |
Brooks | MTX 4000 | Wafer Sorter | - |
| 73279 |
|
Brooks MTX 2000 Wafer Sorter |
Brooks | MTX 2000 | Wafer Sorter | - |
| 73278 |
|
ASML Yield Star S 250 Overlay Measurement System |
ASML | Yield Star S 250 | Overlay Measurement System | - |
| 73277 |
|
ASML ESC 400 RDA |
ASML | ESC 400 | RDA | - |
| 73276 |
|
ASML ESC 320 RDA |
ASML | ESC 320 | RDA | - |
| 73275 |
|
ASM Eagle XP CVD (Chemical Vapor Deposition) |
ASM | Eagle XP | CVD (Chemical Vapor Deposition) | - |
| 73274 |
|
ASM Eagle 12 CVD (Chemical Vapor Deposition) |
ASM | Eagle 12 | CVD (Chemical Vapor Deposition) | - |
| 73273 |
|
ASM A 412 Diffusion Furnace |
ASM | A 412 | Diffusion Furnace | - |
| 73272 |
|
Applied Materials VHCPPL Implanter |
Applied Materials | VHCPPL | Implanter | - |
| 73271 |
|
Applied Materials VHCP Implanter |
Applied Materials | VHCP | Implanter | - |
| 73270 |
|
Applied Materials Reflexion CMP (Chemical Mechanical Polisher) |
Applied Materials | Reflexion | CMP (Chemical Mechanical Polisher) | - |
| 73269 |
|
Applied Materials Reflexion 5 Z CMP (Chemical Mechanical Polisher) |
Applied Materials | Reflexion 5 Z | CMP (Chemical Mechanical Polisher) | - |
| 73268 |
|
Applied Materials Reflexion CMP (Chemical Mechanical Polisher) |
Applied Materials | Reflexion | CMP (Chemical Mechanical Polisher) | - |
| 73267 |
|
Applied Materials Reflexion 5 Z CMP (Chemical Mechanical Polisher) |
Applied Materials | Reflexion 5 Z | CMP (Chemical Mechanical Polisher) | - |
| 73266 |
|
Applied Materials Raider Wet Process |
Applied Materials | Raider | Wet Process | - |