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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 73361 |
|
Tel NT 333 ALD (Atomic Layer Deposition) |
Tel | NT 333 | ALD (Atomic Layer Deposition) | - |
| 73360 |
|
Tel NS 300 Wafer Scrubber |
Tel | NS 300 | Wafer Scrubber | - |
| 73359 |
|
Tel Lithius Coater / Developer |
Tel | Lithius | Coater / Developer | - |
| 73358 |
|
Tel LIPRZ 2 G |
Tel | LIPRZ 2 G | - | - |
| 73357 |
|
Tel LI |
Tel | LI | - | - |
| 73356 |
|
Tel Indy Plus Etcher |
Tel | Indy Plus | Etcher | - |
| 73355 |
|
Tel Indy Etcher |
Tel | Indy | Etcher | - |
| 73354 |
|
Tel Formula |
Tel | Formula | - | - |
| 73353 |
|
Tel EXP |
Tel | EXP | - | - |
| 73352 |
|
Tel CERW |
Tel | CERW | - | - |
| 73351 |
|
Tel CELPL |
Tel | CELPL | - | - |
| 73350 |
|
Tel Act 12 Coater / Developer |
Tel | Act 12 | Coater / Developer | - |
| 73349 |
|
Tel A 303 I Furnace |
Tel | A 303 I | Furnace | - |
| 73348 |
|
SKDO RF 3 S |
SKDO | RF 3 S | - | - |
| 73347 |
|
SES BW 30 X |
SES | BW 30 X | - | - |
| 73346 |
|
RGHT RP 3000 AMHS |
RGHT | RP 3000 | AMHS | - |
| 73345 |
|
Revera RVX Inspection System |
Revera | RVX | Inspection System | - |
| 73344 |
|
PSK SPRA 4 |
PSK | SPRA 4 | - | - |
| 73343 |
|
ONTO UNF 7900 |
ONTO | UNF 7900 | - | - |
| 73342 |
|
ONTO / Rudolph / August NSX 105 Prober |
ONTO / Rudolph / August | NSX 105 | Prober | - |
| 73341 |
|
ONTO Meta 300 |
ONTO | Meta 300 | - | - |
| 73340 |
|
ONTO / Rudolph AXI 940 RDA |
ONTO / Rudolph | AXI 940 | RDA | - |
| 73339 |
|
Olympus AMHS |
Olympus | - | AMHS | - |
| 73338 |
|
Nova 3090 NTSA |
Nova | 3090 NTSA | - | - |
| 73337 |
|
Nova 3090 |
Nova | 3090 | - | - |
| 73336 |
|
Nissin Exceed 30 Implanter |
Nissin | Exceed 30 | Implanter | - |
| 73335 |
|
Nikon S 308 F |
Nikon | S 308 F | - | - |
| 73334 |
|
Nikon NSR S 308 |
Nikon | NSR S 308 | - | - |
| 73333 |
|
Nikon AMI 3500 Wafer Tester |
Nikon | AMI 3500 | Wafer Tester | - |
| 73332 |
|
MTSN SUPM |
MTSN | SUPM | - | - |
| 73331 |
|
MTSN ASPHT Wet Process |
MTSN | ASPHT | Wet Process | - |
| 73330 |
|
Micron C 1 D Prober |
Micron | C 1 D | Prober | - |
| 73329 |
|
Lam VEXT CVD (Chemical Vapor Deposition) |
Lam | VEXT | CVD (Chemical Vapor Deposition) | - |
| 73328 |
|
Lam VEXP CVD (Chemical Vapor Deposition) |
Lam | VEXP | CVD (Chemical Vapor Deposition) | - |
| 73327 |
|
Lam / Novellus / Gasonics Speed CVD (Chemical Vapor Deposition) |
Lam / Novellus / Gasonics | Speed | CVD (Chemical Vapor Deposition) | - |
| 73326 |
|
Lam Mentor |
Lam | Mentor | - | - |
| 73325 |
|
Lam Kiyo EX Dry Etcher |
Lam | Kiyo EX | Dry Etcher | - |
| 73324 |
|
Lam GXPR |
Lam | GXPR | - | - |
| 73323 |
|
Lam Flex FX Dry Etcher |
Lam | Flex FX | Dry Etcher | - |
| 73322 |
|
Lam Flex Expl Dry Etcher |
Lam | Flex Expl | Dry Etcher | - |
| 73321 |
|
Lam Exelan Dry Etch Chamber |
Lam | Exelan | Dry Etch Chamber | - |
| 73320 |
|
Lam EOS |
Lam | EOS | - | - |
| 73319 |
|
Lam Corvan 2 |
Lam | Corvan 2 | - | - |
| 73318 |
|
Lam ALT CVD (Chemical Vapor Deposition) |
Lam | ALT | CVD (Chemical Vapor Deposition) | - |
| 73317 |
|
KLA Visedge Wafer Inspection System |
KLA | Visedge | Wafer Inspection System | - |
| 73316 |
Sold
|
KLA Surfscan SP 2 Particle Defect System |
KLA | Surfscan SP 2 | Particle Defect System | - |
| 73315 |
|
KLA FX 200 Film Thickness Measurement System |
KLA | FX 200 | Film Thickness Measurement System | - |
| 73314 |
|
KLA FX 100 Metrology System |
KLA | FX 100 | Metrology System | - |