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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 153052 |
|
Expertech / Aviza / SVG VTR 7000 Vertical Furnace |
Expertech / Aviza / SVG | VTR 7000 | Vertical Furnace | 8 inch |
| 153051 |
|
Expertech / Aviza / SVG VTR 7000 Vertical Furnace |
Expertech / Aviza / SVG | VTR 7000 | Vertical Furnace | 6 inch |
| 153050 |
|
Bruker / Veeco Dimension 7000 AFM (Atomic Force Microscope) |
Bruker / Veeco | Dimension 7000 | AFM (Atomic Force Microscope) | 8 inch |
| 153049 |
|
Applied Microstructures MVD 150 MVD (Molecular Vapor Deposition) |
Applied Microstructures | MVD 150 | MVD (Molecular Vapor Deposition) | 8 inch |
| 153048 |
|
Applied Materials / Varian VIISta Plad High Current Implanter |
Applied Materials / Varian | VIISta Plad | High Current Implanter | 12 inch |
| 153047 |
|
Advantest / Agilent / HP / Verigy V 4400 Memory Tester |
Advantest / Agilent / HP / Verigy | V 4400 | Memory Tester | 12 inch |
| 153043 |
|
Applied Materials Endura 5500 PVD (Physical Vapor Deposition) |
Applied Materials | Endura 5500 | PVD (Physical Vapor Deposition) | 8 inch |
| 153036 |
|
National Instruments PXIe 4081 DMM (Digital Multimeter) |
National Instruments | PXIe 4081 | DMM (Digital Multimeter) | - |
| 153035 |
|
National Instruments PXIe 5172 Oscilloscope |
National Instruments | PXIe 5172 | Oscilloscope | - |
| 153034 |
|
Sigmatech UltraMap 200 BP Film Thickness Measurement System |
Sigmatech | UltraMap 200 BP | Film Thickness Measurement System | 6 inch |
| 153033 |
|
Kinetics Aeris Piranha Batch Wafer Processing |
Kinetics | Aeris Piranha | Batch Wafer Processing | 6 inch |
| 153032 |
|
Kinetics Mercury Hood |
Kinetics | Mercury | Hood | 6 inch |
| 153031 |
|
Keysight / Agilent 4073 B Parametric Tester |
Keysight / Agilent | 4073 B | Parametric Tester | 8 inch |
| 153030 |
|
Keysight / Agilent 4072 B Parametric Tester |
Keysight / Agilent | 4072 B | Parametric Tester | 8 inch |
| 153029 |
|
Keysight / Agilent 4072 B Parametric Tester |
Keysight / Agilent | 4072 B | Parametric Tester | 8 inch |
| 153028 |
|
Keysight / Agilent 4072 A Parametric Tester |
Keysight / Agilent | 4072 A | Parametric Tester | 8 inch |
| 153027 |
|
Keysight / Agilent 4062 B Parametric Tester |
Keysight / Agilent | 4062 B | Parametric Tester | 8 inch |
| 153026 |
|
Keysight / Agilent 4062 UX Parametric Tester |
Keysight / Agilent | 4062 UX | Parametric Tester | 8 inch |
| 153025 |
|
Keysight / Agilent 4062 UX Parametric Tester |
Keysight / Agilent | 4062 UX | Parametric Tester | 8 inch |
| 153024 |
|
Keyence VHX 500 Profilometer |
Keyence | VHX 500 | Profilometer | 8 inch |
| 153023 |
|
Kaijo 778 T A Batch Wafer Processing |
Kaijo | 778 T A | Batch Wafer Processing | 8 inch |
| 153022 |
|
JTEKT VF 5100 Vertical Furnace |
JTEKT | VF 5100 | Vertical Furnace | 8 inch |
| 153021 |
|
JTEKT VF 3000 Vertical Furnace |
JTEKT | VF 3000 | Vertical Furnace | 6 inch |
| 153020 |
|
Bruker / Jordan Valley JVX 7200 XRF Spectrometer (X-ray Fluorescence) |
Bruker / Jordan Valley | JVX 7200 | XRF Spectrometer (X-ray Fluorescence) | 12 inch |
| 153019 |
|
Jeol JWS 7555 S DR-SEM (Defect Review Scanning Electron Microscope) |
Jeol | JWS 7555 S | DR-SEM (Defect Review Scanning Electron Microscope) | 8 inch |
| 153018 |
|
Jeol JWS 7555 DR-SEM (Defect Review Scanning Electron Microscope) |
Jeol | JWS 7555 | DR-SEM (Defect Review Scanning Electron Microscope) | 8 inch |
| 153017 |
|
Jeol JFS 9855 S FIB (Focused Ion Beam) |
Jeol | JFS 9855 S | FIB (Focused Ion Beam) | 8 inch |
| 153016 |
|
Jeol JFS 9815 FIB (Focused Ion Beam) |
Jeol | JFS 9815 | FIB (Focused Ion Beam) | 8 inch |
| 153015 |
|
Lam / IPEC Momentum CMP (Chemical Mechanical Polisher) |
Lam / IPEC | Momentum | CMP (Chemical Mechanical Polisher) | 8 inch |
| 153014 |
|
Lam / IPEC AvantGaard 776 Tungsten CMP (Chemical Mechanical Polisher) |
Lam / IPEC | AvantGaard 776 Tungsten | CMP (Chemical Mechanical Polisher) | 8 inch |
| 153013 |
|
Lam / IPEC 372 M CMP (Chemical Mechanical Polisher) |
Lam / IPEC | 372 M | CMP (Chemical Mechanical Polisher) | 8 inch |
| 153012 |
|
Innomax Astro 1043 Spin Etcher |
Innomax | Astro 1043 | Spin Etcher | 6 inch |
| 153011 |
|
Innomax Astro 1041 Etcher |
Innomax | Astro 1041 | Etcher | 6 inch |
| 153010 |
|
Innomax Astro 1021 Wafer Scrubber |
Innomax | Astro 1021 | Wafer Scrubber | 6 inch |
| 153009 |
|
InnoLas IL 2600 Wafer ID Sorter |
InnoLas | IL 2600 | Wafer ID Sorter | 6 inch |
| 153008 |
|
Horiba PR PD 35 Reticle Inspection |
Horiba | PR PD 35 | Reticle Inspection | 12 inch |
| 153007 |
|
Horiba PR PD 2 Reticle Inspection |
Horiba | PR PD 2 | Reticle Inspection | 12 inch |
| 153006 |
|
Horiba PD 3000 Reticle Inspection |
Horiba | PD 3000 | Reticle Inspection | 8 inch |
| 153005 |
|
Hitachi S 9220 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9220 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 153004 |
|
Hitachi S 8840 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8840 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 153003 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 153002 |
|
Hitachi S 7800 DR-SEM (Defect Review Scanning Electron Microscope) |
Hitachi | S 7800 | DR-SEM (Defect Review Scanning Electron Microscope) | 8 inch |
| 153001 |
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | 8 inch |
| 153000 |
|
Hitachi M 9010 XST Etcher |
Hitachi | M 9010 XST | Etcher | 12 inch |
| 152999 |
|
Hitachi LS 9300 Particle Measurement |
Hitachi | LS 9300 | Particle Measurement | 12 inch |
| 152998 |
|
Hitachi CG 4000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 152997 |
|
GSI Lumonics WaferMark II Laser Scriber |
GSI Lumonics | WaferMark II | Laser Scriber | 8 inch |
| 152996 |
|
GL Automation SWL 8 Wafer Sorter |
GL Automation | SWL 8 | Wafer Sorter | 8 inch |