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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 153101 |
|
KLA Prometrix UV 1250 SE Film Thickness Measurement System |
KLA | Prometrix UV 1250 SE | Film Thickness Measurement System | 8 inch |
| 153100 |
|
KLA Prometrix UV 1050 Film Thickness Measurement System |
KLA | Prometrix UV 1050 | Film Thickness Measurement System | 8 inch |
| 153099 |
|
KLA TeraStar SLF 17 HR USRA Reticle Inspection |
KLA | TeraStar SLF 17 HR USRA | Reticle Inspection | 12 inch |
| 153098 |
|
KLA Surfscan SP 1 TBI Particle Measurement |
KLA | Surfscan SP 1 TBI | Particle Measurement | 8 inch |
| 153097 |
|
KLA Surfscan SP 2.5 + Particle Measurement |
KLA | Surfscan SP 2.5 + | Particle Measurement | 12 inch |
| 153096 |
|
KLA Surfscan 6420 Unpatterned Surface Inspection System |
KLA | Surfscan 6420 | Unpatterned Surface Inspection System | 8 inch |
| 153095 |
|
KLA Surfscan 6400 Particle Measurement |
KLA | Surfscan 6400 | Particle Measurement | 8 inch |
| 153094 |
|
KLA Surfscan 6200 Particle Measurement |
KLA | Surfscan 6200 | Particle Measurement | 8 inch |
| 153093 |
|
KLA SpectraShape 9000 Critical Dimension (CD) Measurement |
KLA | SpectraShape 9000 | Critical Dimension (CD) Measurement | 12 inch |
| 153092 |
|
KLA SpectraShape 9000 Critical Dimension (CD) Measurement |
KLA | SpectraShape 9000 | Critical Dimension (CD) Measurement | 12 inch |
| 153091 |
|
KLA SpectraCD 100 Critical Dimension (CD) Measurement |
KLA | SpectraCD 100 | Critical Dimension (CD) Measurement | 12 inch |
| 153090 |
|
KLA Puma 9650 Darkfield Inspection |
KLA | Puma 9650 | Darkfield Inspection | 12 inch |
| 153089 |
|
KLA P 16+ Profilometer |
KLA | P 16+ | Profilometer | 6 inch |
| 153088 |
|
KLA OmniMap RS 75 TCA Resistivity Measurement |
KLA | OmniMap RS 75 TCA | Resistivity Measurement | 8 inch |
| 153087 |
|
KLA HRP 340 Profilometer |
KLA | HRP 340 | Profilometer | 12 inch |
| 153086 |
Sold
|
KLA HRP 220 Profilometer |
KLA | HRP 220 | Profilometer | 8 inch |
| 153085 |
|
KLA FLX 2320 Stress Measurement |
KLA | FLX 2320 | Stress Measurement | 8 inch |
| 153084 |
|
KLA eS 805 E-Beam Inspection |
KLA | eS 805 | E-Beam Inspection | 12 inch |
| 153083 |
|
KLA eDR 7200 i DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 7200 i | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153082 |
|
KLA eDR 7100 DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 7100 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153081 |
|
KLA eDR 7000 DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 7000 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153080 |
|
KLA eDR 5210 DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 5210 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153079 |
|
KLA Capres A 300 microRSP Resistivity Measurement |
KLA | Capres A 300 microRSP | Resistivity Measurement | 12 inch |
| 153078 |
|
KLA Candela 8520 Wafer Inspection Equipment |
KLA | Candela 8520 | Wafer Inspection Equipment | 6 inch |
| 153077 |
|
KLA ATL 150 i Overlay Measurement System |
KLA | ATL 150 i | Overlay Measurement System | 12 inch |
| 153075 |
|
KLA Archer C 700 WT Overlay Measurement System |
KLA | Archer C 700 WT | Overlay Measurement System | 12 inch |
| 153074 |
|
KLA Archer 500 AIM SCOL Overlay Measurement System |
KLA | Archer 500 AIM SCOL | Overlay Measurement System | 12 inch |
| 153073 |
|
KLA Archer 200 AIM Overlay Measurement System |
KLA | Archer 200 AIM | Overlay Measurement System | 12 inch |
| 153072 |
|
KLA Archer 200 AIM Overlay Measurement System |
KLA | Archer 200 AIM | Overlay Measurement System | 12 inch |
| 153071 |
|
KLA Altair 8920 Darkfield Inspection |
KLA | Altair 8920 | Darkfield Inspection | 8 inch |
| 153070 |
|
KLA Altair 8920 Darkfield Inspection |
KLA | Altair 8920 | Darkfield Inspection | 8 inch |
| 153069 |
|
KLA Alpha Step 500 Profilometer |
KLA | Alpha Step 500 | Profilometer | 8 inch |
| 153068 |
|
KLA Aleris 8350 Film Thickness Measurement System |
KLA | Aleris 8350 | Film Thickness Measurement System | 12 inch |
| 153067 |
|
KLA Aleris 8350 Film Thickness Measurement System |
KLA | Aleris 8350 | Film Thickness Measurement System | 12 inch |
| 153066 |
|
KLA AIT XP+ Darkfield Inspection |
KLA | AIT XP+ | Darkfield Inspection | 8 inch |
| 153065 |
|
KLA AIT UV Darkfield Inspection |
KLA | AIT UV | Darkfield Inspection | 12 inch |
| 153064 |
|
KLA AIT II Darkfield Inspection |
KLA | AIT II | Darkfield Inspection | 8 inch |
| 153063 |
|
KLA 8250 XP CD-SEM (Critical Dimension Scanning Electron Microscope) |
KLA | 8250 XP | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6 inch |
| 153062 |
|
KLA 5200 XP Overlay Measurement System |
KLA | 5200 XP | Overlay Measurement System | 8 inch |
| 153061 |
|
KLA 5200 XP Overlay Measurement System |
KLA | 5200 XP | Overlay Measurement System | 8 inch |
| 153060 |
|
KLA 2139 Brightfield Inspection |
KLA | 2139 | Brightfield Inspection | 8 inch |
| 153059 |
|
KLA 2138 XP Brightfield Inspection |
KLA | 2138 XP | Brightfield Inspection | 8 inch |
| 153058 |
|
KLA 2138 Brightfield Inspection |
KLA | 2138 | Brightfield Inspection | 8 inch |
| 153057 |
|
KLA 2133 Brightfield Inspection |
KLA | 2133 | Brightfield Inspection | 8 inch |
| 153056 |
|
Keyence / QES WIS 1000 Wafer Inspection Equipment |
Keyence / QES | WIS 1000 | Wafer Inspection Equipment | 6 inch |
| 153055 |
|
HTT High Tech Trade / IOSS WID 150 R Wafer ID Reader |
HTT High Tech Trade / IOSS | WID 150 R | Wafer ID Reader | 6 inch |
| 153054 |
|
HSEB Axiospect 300 Optical Review System |
HSEB | Axiospect 300 | Optical Review System | 12 inch |
| 153053 |
|
HSEB Axiospect 300 Optical Review System |
HSEB | Axiospect 300 | Optical Review System | 12 inch |