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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 37045 |
|
Zwick Top Load Device or Vertical Compression Tester |
Zwick | - | Top Load Device or Vertical Compression Tester | - |
| 37046 |
|
ASM AS 209 3 x Toggle Press System |
ASM | AS 209 3 x | Toggle Press System | - |
| 37047 |
|
Applied Materials Inductively Coupled Parallel Plate Semiconductor Dielectric Etch (IPS) Chamber |
Applied Materials | - | Inductively Coupled Parallel Plate Semiconductor Dielectric Etch (IPS) Chamber | 8 inch |
| 37048 |
|
Branson IPC 3000 Barrel Asher |
Branson | IPC 3000 | Barrel Asher | - |
| 37049 |
|
EVG 640 |
EVG | 640 | - | - |
| 37050 |
|
EVG 520 |
EVG | 520 | - | - |
| 37051 |
|
FSI Mercury OC Cleaning Tool |
FSI | Mercury OC | Cleaning Tool | 8 inch |
| 37052 |
|
Lam / Novellus / Gasonics Vertical High Pressure (VHP) Furnace |
Lam / Novellus / Gasonics | - | Vertical High Pressure (VHP) Furnace | - |
| 37053 |
|
Jeol JWS 7550 Wafer Inspection System |
Jeol | JWS 7550 | Wafer Inspection System | - |
| 37054 |
|
Bruker / Jordan Valley JVX 5200 T Thin Film Measurement System |
Bruker / Jordan Valley | JVX 5200 T | Thin Film Measurement System | 8, 12 inch |
| 37055 |
|
Junsung Eureka 3000 CVD (Chemical Vapor Deposition) |
Junsung | Eureka 3000 | CVD (Chemical Vapor Deposition) | 8, 12 inch |
| 37056 |
|
SUSS PR 800 DUV Track (Deep Ultraviolet) |
SUSS | PR 800 | DUV Track (Deep Ultraviolet) | 8 inch |
| 37057 |
|
KLA QTX 300 Gate Oxide Measurement Tool |
KLA | QTX 300 | Gate Oxide Measurement Tool | 8, 12 inch |
| 37058 |
|
Matrix Jaguar Asher |
Matrix | Jaguar | Asher | - |
| 37059 |
|
Nada Technologies SMIF 300 FL Wafer Sorter |
Nada Technologies | SMIF 300 FL | Wafer Sorter | - |
| 37060 |
|
Lam / Novellus Concept Three Vector PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Lam / Novellus | Concept Three Vector | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | - |
| 37061 |
|
Lam / Novellus Concept Three Sola, Vector UVTP- PECVD (Ultraviolet Thermal Processing - Plasma-Enhanced Chemical Vapor Deposition) |
Lam / Novellus | Concept Three Sola, Vector | UVTP- PECVD (Ultraviolet Thermal Processing - Plasma-Enhanced Chemical Vapor Deposition) | - |
| 37062 |
|
Olympus MX 80 F Defect Inspection Tool |
Olympus | MX 80 F | Defect Inspection Tool | 8, 12 inch |
| 37063 |
|
Olympus FR 3200 Automated Defect Classification Defview Review & UV Inspection Scope |
Olympus | FR 3200 | Automated Defect Classification Defview Review & UV Inspection Scope | - |
| 37064 |
|
Philips Impulse 300 B Laser Based Film Measurement Tool |
Philips | Impulse 300 B | Laser Based Film Measurement Tool | 8, 12 inch |
| 37065 |
|
Lam / SEZ 1300 Silicon Wafer R&D |
Lam / SEZ | 1300 | Silicon Wafer R&D | - |
| 37066 |
|
SVGL Micrascan III Lithography System |
SVGL | Micrascan III | Lithography System | 8 inch |
| 37067 |
|
SVGL Micrascan III |
SVGL | Micrascan III | - | 8 inch |
| 37068 |
|
Tel Trias SPA Plasma Nitridation System |
Tel | Trias SPA | Plasma Nitridation System | 8, 12 inch |
| 37069 |
|
Tel Lithius Clean Track |
Tel | Lithius | Clean Track | - |
| 37070 |
|
Lam / Novellus Concept Three Speed CVD (Chemical Vapor Deposition) |
Lam / Novellus | Concept Three Speed | CVD (Chemical Vapor Deposition) | - |
| 37071 |
|
Hitachi S 4700 II FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 II | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 37072 |
|
Lam / Novellus / Gasonics Altus W-CVD (Chemical Vapor Deposition) |
Lam / Novellus / Gasonics | Altus | W-CVD (Chemical Vapor Deposition) | - |
| 37073 |
|
Tel Indy Plus ALD (Atomic Layer Deposition) |
Tel | Indy Plus | ALD (Atomic Layer Deposition) | - |
| 37074 |
|
FSI Antares CX 300 Cryo Cleaning System |
FSI | Antares CX 300 | Cryo Cleaning System | - |
| 37075 |
|
Semitool Raider CLN |
Semitool | Raider | CLN | - |
| 37076 |
|
Thermo Fisher Scientific / FEI Expida 1255 Analysis System |
Thermo Fisher Scientific / FEI | Expida 1255 | Analysis System | - |
| 37077 |
|
Thermo Fisher Scientific / FEI Expida 1255 Analysis System |
Thermo Fisher Scientific / FEI | Expida 1255 | Analysis System | - |
| 37078 |
|
Thermo Fisher Scientific / FEI Expida 1255 Analysis System |
Thermo Fisher Scientific / FEI | Expida 1255 | Analysis System | - |
| 37079 |
|
ONTO / Rudolph MP 3 300 XCU |
ONTO / Rudolph | MP 3 300 XCU | - | - |
| 37080 |
|
Bruker / Veeco Dimension X 3 D Metrology System |
Bruker / Veeco | Dimension X 3 D | Metrology System | - |
| 37081 |
|
Hitachi M 712 XT Poly Etcher |
Hitachi | M 712 XT | Poly Etcher | - |
| 37082 |
|
KLA Surfscan Particle Defect System |
KLA | Surfscan | Particle Defect System | - |
| 37083 |
|
ONTO / Rudolph FE VII Ellipsometer |
ONTO / Rudolph | FE VII | Ellipsometer | 8 inch |
| 37084 |
|
Jeol JEM 2010 UHR HREM |
Jeol | JEM 2010 UHR | HREM | - |
| 37085 |
|
Hitachi S 5000 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5000 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 37086 |
|
KLA 2365 |
KLA | 2365 | - | - |
| 37087 |
|
KLA FIT 3120 Particle Counter |
KLA | FIT 3120 | Particle Counter | - |
| 37088 |
|
Bruker / Veeco NT 3300 Analysis System |
Bruker / Veeco | NT 3300 | Analysis System | - |
| 37089 |
|
Zeiss Axiotron EDS (Energy Dispersive Spectroscopy) |
Zeiss | Axiotron | EDS (Energy Dispersive Spectroscopy) | - |
| 37090 |
|
Reichert Polyvar SC 300901 EDS (Energy Dispersive Spectroscopy) |
Reichert | Polyvar SC 300901 | EDS (Energy Dispersive Spectroscopy) | - |
| 37091 |
|
Nikon Optiphot 200 EDS (Energy Dispersive Spectroscopy) |
Nikon | Optiphot 200 | EDS (Energy Dispersive Spectroscopy) | - |
| 37092 |
|
Thermo Scientific / Nicolet ECO 1000 Metro |
Thermo Scientific / Nicolet | ECO 1000 | Metro | - |