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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
68541 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 2782 |
|
Lam 9600 series Metal Etcher |
Lam | 9600 series | Metal Etcher | 6 inch |
| 2783 |
|
KLA / Leica LDS 3300 M Inspection System |
KLA / Leica | LDS 3300 M | Inspection System | 12 inch |
| 2784 |
|
KLA / Leica LDS 3300 M Inspection System |
KLA / Leica | LDS 3300 M | Inspection System | 12 inch |
| 2785 |
|
Leo Instruments / Cambridge S 260 SEM (Scanning Electron Microscope) |
Leo Instruments / Cambridge | S 260 | SEM (Scanning Electron Microscope) | - |
| 2786 |
|
Mattson 2800 Epsilon RTP System (Rapid Thermal Process) |
Mattson | 2800 Epsilon | RTP System (Rapid Thermal Process) | 8 inch |
| 2787 |
|
Mattson 2800 Epsilon RTP System (Rapid Thermal Process) |
Mattson | 2800 Epsilon | RTP System (Rapid Thermal Process) | 8 inch |
| 2788 |
|
Mattson 2800 Epsilon RTP System (Rapid Thermal Process) |
Mattson | 2800 Epsilon | RTP System (Rapid Thermal Process) | 8 inch |
| 2789 |
|
Micro Instrument PE 9020 Electromigration Evaluation |
Micro Instrument | PE 9020 | Electromigration Evaluation | - |
| 2790 |
|
Micro Instrument PE 9020 Electromigration Evaluation |
Micro Instrument | PE 9020 | Electromigration Evaluation | - |
| 2791 |
|
MRC 600 Series PVD (Physical Vapor Deposition) |
MRC | 600 Series | PVD (Physical Vapor Deposition) | 6 inch |
| 2792 |
|
ONTO / Nanometrics 210 AFT Thin Film Measurement System |
ONTO / Nanometrics | 210 AFT | Thin Film Measurement System | 8 inch |
| 2793 |
|
ONTO / Nanometrics 210 AFT Thin Film Measurement System |
ONTO / Nanometrics | 210 AFT | Thin Film Measurement System | 8 inch |
| 2794 |
|
ONTO / Nanometrics 210 XP AFT Thin Film Measurement System |
ONTO / Nanometrics | 210 XP AFT | Thin Film Measurement System | 6 inch |
| 2795 |
|
ONTO / Nanometrics Nanospec M 5100 Inspection System |
ONTO / Nanometrics | Nanospec M 5100 | Inspection System | 8 inch |
| 2796 |
|
ONTO / Nanometrics Nanospec M 5100 Inspection System |
ONTO / Nanometrics | Nanospec M 5100 | Inspection System | 8 inch |
| 2797 |
|
Nikon AMI 2000 Surface Analyzer |
Nikon | AMI 2000 | Surface Analyzer | - |
| 2798 |
|
Nikon AMI 3000 Surface Analyzer |
Nikon | AMI 3000 | Surface Analyzer | 8 inch |
| 2799 |
|
Nikon AMI 3000 Surface Analyzer |
Nikon | AMI 3000 | Surface Analyzer | - |
| 2800 |
|
Nikon NSR 2205 EX 14 C Stepper |
Nikon | NSR 2205 EX 14 C | Stepper | 8 inch |
| 2801 |
|
Nikon NSR 2205 EX 14 C Stepper |
Nikon | NSR 2205 EX 14 C | Stepper | 8 inch |