English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
68538 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 2745 |
|
GSI Lumonics M 310 Laser Repair System |
GSI Lumonics | M 310 | Laser Repair System | - |
| 2746 |
|
Hitachi S 5000 SEM (Scanning Electron Microscope) |
Hitachi | S 5000 | SEM (Scanning Electron Microscope) | 8 inch |
| 2747 |
|
Hitachi WA 1350 Surface Profilometer |
Hitachi | WA 1350 | Surface Profilometer | 12 inch |
| 2748 |
|
Incal Technology i 9470 Burn-In Tester |
Incal Technology | i 9470 | Burn-In Tester | - |
| 2749 |
|
JEL Cyclone Plus Metal CVD (Chemical Vapor Deposition) |
JEL | Cyclone Plus | Metal CVD (Chemical Vapor Deposition) | 12 inch |
| 2750 |
|
JEL Cyclone Plus Metal CVD (Chemical Vapor Deposition) |
JEL | Cyclone Plus | Metal CVD (Chemical Vapor Deposition) | 12 inch |
| 2751 |
|
Jeol JWS 3000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Jeol | JWS 3000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 2752 |
|
Jeol JWS 3000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Jeol | JWS 3000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 2753 |
|
Bruker / Jordan Valley JVX 6200 Thin Film Measurement System |
Bruker / Jordan Valley | JVX 6200 | Thin Film Measurement System | 12 inch |
| 2754 |
|
KLA 2135 Brightfield Inspection |
KLA | 2135 | Brightfield Inspection | 8 inch |
| 2755 |
|
KLA 2139 Brightfield Inspection |
KLA | 2139 | Brightfield Inspection | 8 inch |
| 2756 |
|
KLA 5300 Overlay Measurement System |
KLA | 5300 | Overlay Measurement System | 8 inch |
| 2757 |
|
KLA 5300 Overlay Measurement System |
KLA | 5300 | Overlay Measurement System | 8 inch |
| 2758 |
|
KLA 5300 Overlay Measurement System |
KLA | 5300 | Overlay Measurement System | 8 inch |
| 2759 |
|
KLA 6200 Inspection System |
KLA | 6200 | Inspection System | 8 inch |
| 2760 |
|
KLA 6200 Inspection System |
KLA | 6200 | Inspection System | 8 inch |
| 2761 |
|
KLA 6420 Inspection System |
KLA | 6420 | Inspection System | 8 inch |
| 2762 |
|
KLA 6420 Inspection System |
KLA | 6420 | Inspection System | 8 inch |
| 2763 |
|
KLA 6420 Inspection System |
KLA | 6420 | Inspection System | 8 inch |
| 2764 |
|
KLA AIT II Defect Inspection System |
KLA | AIT II | Defect Inspection System | 8 inch |