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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
68557 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 153080 |
|
KLA eDR 5210 DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 5210 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153081 |
|
KLA eDR 7000 DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 7000 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153082 |
|
KLA eDR 7100 DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 7100 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153083 |
|
KLA eDR 7200 i DR-SEM (Defect Review Scanning Electron Microscope) |
KLA | eDR 7200 i | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 153084 |
|
KLA eS 805 E-Beam Inspection |
KLA | eS 805 | E-Beam Inspection | 12 inch |
| 153085 |
|
KLA FLX 2320 Stress Measurement |
KLA | FLX 2320 | Stress Measurement | 8 inch |
| 153086 |
Sold
|
KLA HRP 220 Profilometer |
KLA | HRP 220 | Profilometer | 8 inch |
| 153087 |
|
KLA HRP 340 Profilometer |
KLA | HRP 340 | Profilometer | 12 inch |
| 153088 |
|
KLA OmniMap RS 75 TCA Resistivity Measurement |
KLA | OmniMap RS 75 TCA | Resistivity Measurement | 8 inch |
| 153089 |
|
KLA P 16 + Profilometer |
KLA | P 16 + | Profilometer | 6, 8 inch |
| 153090 |
|
KLA Puma 9650 Darkfield Inspection |
KLA | Puma 9650 | Darkfield Inspection | 12 inch |
| 153091 |
|
KLA SpectraCD 100 Critical Dimension (CD) Measurement |
KLA | SpectraCD 100 | Critical Dimension (CD) Measurement | 12 inch |
| 153092 |
|
KLA SpectraShape 9000 Critical Dimension (CD) Measurement |
KLA | SpectraShape 9000 | Critical Dimension (CD) Measurement | 12 inch |
| 153093 |
|
KLA SpectraShape 9000 Critical Dimension (CD) Measurement |
KLA | SpectraShape 9000 | Critical Dimension (CD) Measurement | 12 inch |
| 153094 |
|
KLA Surfscan 6200 Particle Measurement |
KLA | Surfscan 6200 | Particle Measurement | 8 inch |
| 153095 |
|
KLA Surfscan 6400 Particle Measurement |
KLA | Surfscan 6400 | Particle Measurement | 8 inch |
| 153096 |
|
KLA Surfscan 6420 Unpatterned Surface Inspection System |
KLA | Surfscan 6420 | Unpatterned Surface Inspection System | 8 inch |
| 153097 |
|
KLA Surfscan SP 2.5 + Particle Measurement |
KLA | Surfscan SP 2.5 + | Particle Measurement | 12 inch |
| 153098 |
|
KLA Surfscan SP 1 TBI Particle Measurement |
KLA | Surfscan SP 1 TBI | Particle Measurement | 8 inch |
| 153099 |
|
KLA TeraStar SLF 17 HR USRA Reticle Inspection |
KLA | TeraStar SLF 17 HR USRA | Reticle Inspection | 12 inch |