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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
68558 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 153058 |
|
KLA 2138 Brightfield Inspection |
KLA | 2138 | Brightfield Inspection | 8 inch |
| 153059 |
|
KLA 2138 XP Brightfield Inspection |
KLA | 2138 XP | Brightfield Inspection | 8 inch |
| 153060 |
|
KLA 2139 Brightfield Inspection |
KLA | 2139 | Brightfield Inspection | 8 inch |
| 153061 |
|
KLA 5200 XP Overlay Measurement System |
KLA | 5200 XP | Overlay Measurement System | 8 inch |
| 153062 |
|
KLA 5200 XP Overlay Measurement System |
KLA | 5200 XP | Overlay Measurement System | 8 inch |
| 153063 |
|
KLA 8250 XP CD-SEM (Critical Dimension Scanning Electron Microscope) |
KLA | 8250 XP | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6 inch |
| 153064 |
|
KLA AIT II Darkfield Inspection |
KLA | AIT II | Darkfield Inspection | 8 inch |
| 153065 |
|
KLA AIT UV Darkfield Inspection |
KLA | AIT UV | Darkfield Inspection | 12 inch |
| 153066 |
|
KLA AIT XP+ Darkfield Inspection |
KLA | AIT XP+ | Darkfield Inspection | 8 inch |
| 153067 |
|
KLA Aleris 8350 Film Thickness Measurement System |
KLA | Aleris 8350 | Film Thickness Measurement System | 12 inch |
| 153068 |
|
KLA Aleris 8350 Film Thickness Measurement System |
KLA | Aleris 8350 | Film Thickness Measurement System | 12 inch |
| 153069 |
|
KLA Alpha Step 500 Profilometer |
KLA | Alpha Step 500 | Profilometer | 8 inch |
| 153070 |
|
KLA Altair 8920 Darkfield Inspection |
KLA | Altair 8920 | Darkfield Inspection | 8 inch |
| 153071 |
|
KLA Altair 8920 Darkfield Inspection |
KLA | Altair 8920 | Darkfield Inspection | 8 inch |
| 153072 |
|
KLA Archer 200 AIM Overlay Measurement System |
KLA | Archer 200 AIM | Overlay Measurement System | 12 inch |
| 153073 |
|
KLA Archer 200 AIM Overlay Measurement System |
KLA | Archer 200 AIM | Overlay Measurement System | 12 inch |
| 153074 |
|
KLA Archer 500 AIM SCOL Overlay Measurement System |
KLA | Archer 500 AIM SCOL | Overlay Measurement System | 12 inch |
| 153075 |
|
KLA Archer C 700 WT Overlay Measurement System |
KLA | Archer C 700 WT | Overlay Measurement System | 12 inch |
| 153077 |
|
KLA ATL 150 i Overlay Measurement System |
KLA | ATL 150 i | Overlay Measurement System | 12 inch |
| 153078 |
|
KLA Candela 8520 Wafer Inspection Equipment |
KLA | Candela 8520 | Wafer Inspection Equipment | 6 inch |