English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
887 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 37367 |
|
Hitachi LS 6800 Wafer Surface Inspection System |
Hitachi | LS 6800 | Wafer Surface Inspection System | - |
| 37430 |
|
Hitachi S 4700 II FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 II | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 37473 |
|
Hitachi S 9200 |
Hitachi | S 9200 | - | - |
| 37978 |
|
Hitachi S 4500 II FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 II | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 41049 |
|
Hitachi S 5200 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5200 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 41050 |
|
Hitachi 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 41316 |
|
Hitachi S 5200 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5200 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 41591 |
|
Hitachi V 1050 Oscilloscope |
Hitachi | V 1050 | Oscilloscope | - |
| 41894 |
|
Hitachi S 3200 H SEM (Scanning Electron Microscope) |
Hitachi | S 3200 H | SEM (Scanning Electron Microscope) | - |
| 41959 |
|
Hitachi SU 70 |
Hitachi | SU 70 | - | - |
| 43669 |
|
Hitachi CG 4000 |
Hitachi | CG 4000 | - | - |
| 43670 |
|
Hitachi HD 2300 STEM |
Hitachi | HD 2300 STEM | - | - |
| 43671 |
|
Hitachi S 5000 |
Hitachi | S 5000 | - | - |
| 43672 |
|
Hitachi S 5200 |
Hitachi | S 5200 | - | - |
| 43673 |
|
Hitachi S 5500 |
Hitachi | S 5500 | - | - |
| 43674 |
|
Hitachi S 8840 |
Hitachi | S 8840 | - | - |
| 43675 |
|
Hitachi S 4700 II |
Hitachi | S 4700 II | - | - |
| 43676 |
|
Hitachi S 4800 II |
Hitachi | S 4800 II | - | - |
| 43880 |
Sold
|
Hitachi S 4700 II FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 II | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 43887 |
|
Hitachi CM 700 Die Bonder |
Hitachi | CM 700 | Die Bonder | - |