English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
884 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 31502 |
|
Hitachi M 4510 XT Etcher / Asher |
Hitachi | M 4510 XT | Etcher / Asher | - |
| 31513 |
|
Hitachi CG 6450 T CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 6450 T | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 31522 |
Sold
|
Hitachi LS 9245 Wafer Surface Inspection System |
Hitachi | LS 9245 | Wafer Surface Inspection System | - |
| 32027 |
|
Hitachi S 5200 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5200 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 32573 |
|
Hitachi H 8100 TEM (Transmission Electron Microscope) |
Hitachi | H 8100 | TEM (Transmission Electron Microscope) | - |
| 32654 |
|
Hitachi U 4100 |
Hitachi | U 4100 | - | - |
| 32685 |
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 32726 |
Sold
|
Hitachi S 4700 SEM (Scanning Electron Microscope) |
Hitachi | S 4700 | SEM (Scanning Electron Microscope) | - |
| 32727 |
|
Hitachi S 4000 SEM (Scanning Electron Microscope) |
Hitachi | S 4000 | SEM (Scanning Electron Microscope) | - |
| 32884 |
|
Hitachi W 5200 |
Hitachi | W 5200 | - | - |
| 32896 |
|
Hitachi S 8620 CD-SEM Parts (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8620 | CD-SEM Parts (Critical Dimension Scanning Electron Microscope) | - |
| 32930 |
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 32979 |
|
Hitachi S 3200 N SEM (Scanning Electron Microscope) |
Hitachi | S 3200 N | SEM (Scanning Electron Microscope) | - |
| 32980 |
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 32991 |
|
Hitachi FB 2000 FIB (Focused Ion Beam) |
Hitachi | FB 2000 | FIB (Focused Ion Beam) | - |
| 33717 |
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 33815 |
Sold
|
Hitachi S 9220 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9220 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 35013 |
|
Hitachi S 4700 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 35097 |
|
Hitachi 6200 H CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | 6200 H | CD-SEM (Critical Dimension Scanning Electron Microscope) | 5 inch |
| 35098 |
|
Hitachi S 570 SEM (Scanning Electron Microscope) |
Hitachi | S 570 | SEM (Scanning Electron Microscope) | - |