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Jeol JEM 1011 TEM (Transmission Electron Microscope)
Jeol JEM 1011 TEM (Transmission Electron Microscope)
Jeol JEM 1011 TEM (Transmission Electron Microscope)
Jeol JEM 1011 TEM (Transmission Electron Microscope)
Jeol JEM 1011 TEM (Transmission Electron Microscope)
Jeol JEM 1011 TEM (Transmission Electron Microscope)

Jeol JEM 1011 TEM (Transmission Electron Microscope)

Asset #: 79872

Make: Jeol

Model: JEM 1011

Last Confirm Date: June 04, 2024

Jeol JEM 1011 TEM (Transmission Electron Microscope)
- HR Pole Piece with resolution of 0.14 nm
- Selected-area Electron Diffraction
- Energy Dispersive Spectroscopy (no mapping)
- Oxford INCA 30 mm2 LN2 detector
- Bottom-mounted AMT CCD digital imaging camera
- Oxford EDS system
- JEOL single tilt holder
- Cryo capabilities
- Bright Field TEM imaging
- Magnification of 50x – 1,500,000
- Accelerating voltage can be adjusted within the range of 80-200 kV
- Ultrahigh resolution (UHR): 0.194 nm (point) / 0.14nm (lattice)
Objective Lens
- Focal length: 1.9 mm
- Spherical aber.: 0.5 mm
- Chromatic aber.: 1.1 mm
- Minimum step: 1.0 nm
Spot Size:
- TEM mode: 20 to 200 nm diameter
- EDS, NBD, CBD mode: 0.5 to 25nm diameter
CB Diffraction
- Convergent angle (2a): 1.5 to 20 mrad or more
- Acceptance angel: +/= 10*
Magnification:
- MAG mode: x2000 to 1,500,000
- Low MAG ode: x50 to 6000
- SA MAG mode: x8000 to 800,000
Camera length:
- SA diff: 80 to 2000mm
- HD diff: 4 to 80m
- HR diff: 333mm
2011 Vintage

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