{"product_id":"74709","title":"Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)","description":"Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope), 4\"\u003cbr\u003eResolution: \u003cbr\u003e- 1nm guaranteed at 15kV SEM mode\u003cbr\u003e- 2.5nm at 1kV in SEM mode\u003cbr\u003e- 1.5nm at 1kV in GB mode\u003cbr\u003eMagnification: \u003cbr\u003e- SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm)\u003cbr\u003e- Low-Mag LM mode: x25 to x19,000 \u003cbr\u003eImaging Modes\/Detectors: \u003cbr\u003e- SEI: Secondary electron imaging\u003cbr\u003e- LM: Low-magnification mode\u003cbr\u003e- GB: Gentle-Beam mode \u003cbr\u003eAccelerating Voltages: \u003cbr\u003e- SEM: 0.5 to 30kV\u003cbr\u003e- GB: 0.1 to 4.0kV\u003cbr\u003eMechanical: \u003cbr\u003e- Max: 70 x 50mm\u003cbr\u003e- 4inch wafer: limited to 25x25mm movement area from wafer center\u003cbr\u003e- Tilt: -5* to 70*\u003cbr\u003e- Rotation: 360*","brand":"Bridge Tronic Global","offers":[{"title":"Default Title","offer_id":44816838983870,"sku":"74709","price":0.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0651\/6175\/6862\/files\/1-done-115_c14dda96-bee4-4913-b1dc-d8c5a0cc34f8.jpg?v=1737598521","url":"https:\/\/www.bridgetronic.com\/products\/74709","provider":"Bridge Tronic Global","version":"1.0","type":"link"}