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Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)
Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)

Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope)

Asset #: 74709

Make: Jeol

Model: JSM 7600 F

Wafer Sizes: 4 inch

Last Confirm Date: January 23, 2024

Jeol JSM 7600 F FE-SEM (Field Emission Scanning Electron Microscope), 4"
Resolution:
- 1nm guaranteed at 15kV SEM mode
- 2.5nm at 1kV in SEM mode
- 1.5nm at 1kV in GB mode
Magnification:
- SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm)
- Low-Mag LM mode: x25 to x19,000
Imaging Modes/Detectors:
- SEI: Secondary electron imaging
- LM: Low-magnification mode
- GB: Gentle-Beam mode
Accelerating Voltages:
- SEM: 0.5 to 30kV
- GB: 0.1 to 4.0kV
Mechanical:
- Max: 70 x 50mm
- 4inch wafer: limited to 25x25mm movement area from wafer center
- Tilt: -5* to 70*
- Rotation: 360*

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