{"product_id":"60232","title":"Jeol 2100 Probe-Corrected Analytical Electron Microscope","description":"Jeol 2100 Probe-Corrected Analytical Electron Microscope\u003cbr\u003e- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS\/EFTEM for elemental mapping and thickness measurements\u003cbr\u003e- Acceleration Voltage: 100 and 200 kV\u003cbr\u003e- Filament: Zirconated Tungsten (100) thermal field emission tip \u003cbr\u003e- Vacuum: Gun ~ 1.0 x 10-9 torr, Column ~1.0 x 10-7 torr\u003cbr\u003e- Resolution : CTEM 0.10 nm lattice \/ point to point, STEM 0.10 nm Cs-Corrected HAADF\u003cbr\u003e- XEDS System: horizontal Ultra thin Window Si-Li X-ray detector capable of detecting elements with Z\u0026gt;5, EDAX r-TEM Detector with EDAX acquisition software\u003cbr\u003e- EELS System: Gatan #863 Tridiem Imaging Filter (GIF) for electron energy loss spectroscopy and imaging.\u003cbr\u003e- Image Acquisition \u0026amp; Analysis System:Gatan Ultrascan 1000 CCD TV camera (Post GIF)\u003cbr\u003e- Other accessories: Free lens control, fully independent control of all lenses. TEMCon PC control software\u003cbr\u003e2010 Vintage","brand":"Bridge Tronic Global","offers":[{"title":"Default Title","offer_id":44815235645630,"sku":"60232","price":0.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0651\/6175\/6862\/files\/BULKB101451_2.jpg?v=1737535664","url":"https:\/\/www.bridgetronic.com\/products\/60232","provider":"Bridge Tronic Global","version":"1.0","type":"link"}