{"product_id":"26694","title":"Thermo Fisher Scientific \/ FEI 1265 Dual Beam FIB (Focused Ion Beam)","description":"Thermo Fisher Scientific \/ FEI 1265 Dual Beam FIB (Focused Ion Beam)\u003cbr\u003e- Electron beam image resolution: 3nm-5nm, 1-30kV beam voltage\u003cbr\u003e- Ion beam resolution: 5nm-7nm, 30kV beam voltage\u003cbr\u003e- Full digital control through Windows environment\u003cbr\u003e- Stage Accuracy: 1.5 µm over 300mm\u003cbr\u003e- FE-SEM with through-the-lens detection\u003cbr\u003e- 1 Load Lock - allows loading of the following: a 200mm wafer, a 300mm wafer, and a 200mm multi-stub holder (for single die, and other small die samples)\u003cbr\u003e- GISs - allow for PD (Platinum Deposition), IEE (Insulator Enhanced Etch) and ID (Insulator Deposition)\u003cbr\u003e- EDX Analysis - on defects (down to 0.2 microns in size)\u003cbr\u003e     *This facility requires LN2, the EDX is supplied\/serviced by Oxford Instruments.\u003cbr\u003e- No Load Ports\u003cbr\u003e- SECS\/GEM Capability\u003cbr\u003e","brand":"Bridge Tronic Global","offers":[{"title":"Default Title","offer_id":44812634456254,"sku":"26694","price":0.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0651\/6175\/6862\/files\/Capture-8.jpg?v=1737444616","url":"https:\/\/www.bridgetronic.com\/products\/26694","provider":"Bridge Tronic Global","version":"1.0","type":"link"}