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Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)
Hitachi S 3400 N SEM (Scanning Electron Microscope)

Hitachi S 3400 N SEM (Scanning Electron Microscope)

Asset #: 159237

Make: Hitachi

Model: S 3400 N

Wafer Sizes: 8 inch

Last Confirm Date: October 14, 2026

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Hitachi S 3400 N SEM (Scanning Electron Microscope), 8"
- Backscattered Electron Image Resolution: 4.0 nm (Low Vacuum Mode)
- Magnification: 5x to 30,000x
- Filament: Cartridge (tungsten hairpin filament)
- Acceleration Voltage: 0.3 to 30 kV
- Image Shift: +/-50 um or less (WD = 10 mm)
Secondary Electron Image Resolution:
- 3.0 nm (High Vacuum Mode)
- 10 nm (High Vacuum Mode, Accelerating Voltage 3 kV)
Specimen Stage: Type II 5 Axis motor-driven unit
- X: 0 to 100 mm
- Y: 0 to 50 mm
- Z (WD): 5 to 65 mm
- Sample Rotation 360 Deg
- Sample Tilt -20-90 Deg
- Max. Sample Size: 200 mm diameter
- Display Unit: W850 x D800 x H1200 mm, 120 kg
- Power Supply: Single Phase AC 100 V, 2 kVVA, 50/60 Hz (main unit)
2005 Vintage

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