{"product_id":"139450","title":"Jeol JSM 7000 F SEM (Scanning Electron Microscope)","description":"Jeol JSM 7000 F SEM (Scanning Electron Microscope)\u003cbr\u003eEquipped With:\u003cbr\u003e- Schottky Field Emission Gun (FEG) Filament\u003cbr\u003e- Energy Dispersive Spectroscopy (EDS)\u003cbr\u003e- Electron Backscattered Diffraction (EBSD)\u003cbr\u003e- Elphy Quantum E-beam Lithography (EBL)\u003cbr\u003eFeatures:\u003cbr\u003e- Resolution: 1.2 nm (at 30 kV), 3 nm (at 1 kV)\u003cbr\u003e- Working Distance: 2 to 40 nm \u003cbr\u003e- Magnification:10 to 19,000 (LM mode), 100 to 500,000 (SEM mode)\u003cbr\u003e- Accelerating Voltage: 0.5 to 30 kV\u003cbr\u003e- Specimen Illumination Current: 0.1 pA to 10 nA\u003cbr\u003e- Electron Gun: Schottky Field Emission\u003cbr\u003e- Alignment: Electromagnetic Deflection System\u003cbr\u003e- Objective Lens: Strongly Excited Conical Lens\u003cbr\u003e- Specimen Chamber: Large Chamber for 200 mm Specimen\u003cbr\u003e- EDS for Materials Identification","brand":"Bridge Tronic Global","offers":[{"title":"Default Title","offer_id":45368218976446,"sku":"139450","price":0.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0651\/6175\/6862\/files\/1_28ac22e3-8a5b-4c18-aafc-f4d7530e2e0f.jpg?v=1757001763","url":"https:\/\/www.bridgetronic.com\/products\/139450","provider":"Bridge Tronic Global","version":"1.0","type":"link"}