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Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)
Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)
Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)
Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)
Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)
Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)

Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)

Asset #: 137610

Make: Thermo Fisher Scientific / FEI

Model: Helios NanoLab 600

Thermo Fisher Scientific / FEI Helios NanoLab 600 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)
Beam:
- Schottky FE mounted on the NG hot swap gun module
- Gallium Liquid Metal
- 1000 h
- ELSTAR
- Sidewinder
- Electron Column
- ION Column
Resolution:
Optional WD
- 0.9 nm at 15 kV
- 1.4 nm at 15 kV
Coincident WD:
- 1 nm at 15 kV
- 1.6 nm at 5 kV
- 2.5 nm at kV
- 5 nm at 30 kV
Magnification: 69x-2300000x
Stage Control: 5 axes motorized XYZRT 6” UHR stage with piezo control
- X/Y = 150mm
- Z = 0-20mm
- T = -10⁰ - +60⁰
- Detector: Through-lens detection (TLD) for SE and BSE
- Omniprobe: Autoprobe 200
- STEM Detector - retractable
- Plasma Cleaner: Ibss Group GV10x

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