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Cameca 4 F SIMS (Secondary Ion Mass Spectrometer)

Asset #: 129202

Make: Cameca

Model: 4 F

Last Confirm Date: February 25, 2025

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Cameca 4 F SIMS (Secondary Ion Mass Spectrometer)
- Mass resolution up to 10,000.
- Duoplasmatron ion source for either positive or negative O or Ar ion generation. Additional pumping and gun isolation (IMPVAC Option) has been installed.
- Cs microbeam ion source with additional pumping and gun isolation (KISOCMS Option) for the production of Cs+ ions.
- Normal incidence electron gun (up-graded Dec99) for charge neutralisation while analysing insulating specimens.
- Scanning ion image option for image collection.
- Charles Evans and Associates control and interface. The software and interface have been upgraded (March 2003) to the Control-PXT V1.0 running under Windows NT.
- ETP Electron Multipliers and ECL fast counting system (14ns dead time) from Pulse-Count Technology Inc.
- Sample voltage may be adjusted from 0 to +4500v or 0 to- 4500v, so that the analyses may be made using ultra high offset techniques.
- An eight sample air lock system working at a vacuum of 2*10-8 Torr.
- Residual gas analyser installed on the sample chamber.
1988 Vintage

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