{"product_id":"127604","title":"Applied Materials UVision SP 200 Brightfield Wafer Inspection Tool","description":"Applied Materials UVision SP 200 Brightfield Wafer Inspection Tool, 12\"\u003cbr\u003e- 3 Phase\u003cbr\u003e- 5 Wire\u003cbr\u003e- 50\/60 Hz\u003cbr\u003e- Designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers\u003cbr\u003e- Ligth source: Laser ( 266 ג =nm)\u003cbr\u003e- Tool scans a wafer in a meander path\u003cbr\u003e- Die to Die ” and Cell to Cell ” comparison capability\u003cbr\u003e- Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection\u003cbr\u003e- On pattern wafers capable of detecting defects of 25 nm with 90 %\u003cbr\u003e- Capture Rate (Data from D\u0026amp;E recipe\u003cbr\u003e2007 Vintage","brand":"Bridge Tronic Global","offers":[{"title":"Default Title","offer_id":44821590671550,"sku":"127604","price":0.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0651\/6175\/6862\/files\/1_Page_3_Image_0003_035d313a-aceb-4341-9e23-936f895b18e4.jpg?v=1746542787","url":"https:\/\/www.bridgetronic.com\/products\/127604","provider":"Bridge Tronic Global","version":"1.0","type":"link"}