English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 152070 |
|
Tel P 12 XL Prober |
Tel | P 12 XL | Prober | - |
| 152069 |
|
Tel P 12 XL Prober |
Tel | P 12 XL | Prober | - |
| 152066 |
|
ESPEC TSE 11 A Thermal Shock Chamber |
ESPEC | TSE 11 A | Thermal Shock Chamber | - |
| 152064 |
|
ESPEC TSE 11 A Thermal Shock Chamber |
ESPEC | TSE 11 A | Thermal Shock Chamber | - |
| 152059 |
|
Applied Materials Ultima HDP |
Applied Materials | Ultima HDP | - | - |
| 152058 |
|
Applied Materials Endura MOCVD (Metal Organic Chemical Vapor Deposition) |
Applied Materials | Endura | MOCVD (Metal Organic Chemical Vapor Deposition) | - |
| 152057 |
|
Applied Materials Centura 5200 DXZ |
Applied Materials | Centura 5200 DXZ | - | - |
| 152056 |
|
Applied Materials Endura 5500 |
Applied Materials | Endura 5500 | - | - |
| 152023 |
|
Teradyne / Nextest Magnum PV SCM Tester |
Teradyne / Nextest | Magnum PV SCM | Tester | - |
| 152021 |
|
SMC HRW 008 HS Z X 013 Chiller |
SMC | HRW 008 HS Z X 013 | Chiller | - |
| 152013 |
|
KLA PN: 339830 Ceramic Puck |
KLA | PN: 339830 | Ceramic Puck | - |
| 152012 |
|
Thermo Neslab MX 500 Chiller |
Thermo Neslab | MX 500 | Chiller | - |
| 152011 |
|
ASM Eagle 60 Wire Bonder |
ASM | Eagle 60 | Wire Bonder | - |
| 152006 |
|
KLA HRP 240 |
KLA | HRP 240 | - | - |
| 152005 |
|
Mattson Aspen II ICP (Inductively Coupled Plasma) |
Mattson | Aspen II | ICP (Inductively Coupled Plasma) | - |
| 152002 |
|
Veeco / Wyko NT 3300 Profilometer |
Veeco / Wyko | NT 3300 | Profilometer | - |
| 152001 |
|
MEI Classic 3 Revolution Wet Bench Batch Develop Hood |
MEI | Classic 3 Revolution | Wet Bench Batch Develop Hood | - |
| 152000 |
|
Perkin Elmer Optima 8000 ICP-OES (Optical Emission Spectrometer) |
Perkin Elmer | Optima 8000 | ICP-OES (Optical Emission Spectrometer) | - |
| 151999 |
|
PGC 9141-1110 Temperature & Humidity Chamber |
PGC | 9141-1110 | Temperature & Humidity Chamber | - |
| 151994 |
|
Perkin Elmer Spectrum Two FTIR Spectrometer (Fourier Transform Infrared) |
Perkin Elmer | Spectrum Two | FTIR Spectrometer (Fourier Transform Infrared) | - |
| 151993 |
|
Cohu Diamondx 2 Work Station |
Cohu | Diamondx 2 | Work Station | - |
| 151989 |
|
Cohu Diamondx 1 Work Station |
Cohu | Diamondx 1 | Work Station | - |
| 151988 |
|
Cohu SDU (System Development Unit) |
Cohu | - | SDU (System Development Unit) | - |
| 151987 |
|
Cohu VIS 16 Part |
Cohu | VIS 16 | Part | - |
| 151986 |
|
Cohu DPIN 96 Part |
Cohu | DPIN 96 | Part | - |
| 151985 |
|
Teradyne PN: 811-081-10 / 866-260-10 Cable |
Teradyne | PN: 811-081-10 / 866-260-10 | Cable | - |
| 151984 |
|
Teradyne MX 230 805-230-60 DC90 Board |
Teradyne | MX 230 805-230-60 | DC90 Board | - |
| 151979 |
|
Thermo Fisher Scientific / FEI Verios 460 L |
Thermo Fisher Scientific / FEI | Verios 460 L | - | - |
| 151960 |
|
KLA / Therma-wave OP 2600 Film Thickness Measurement |
KLA / Therma-wave | OP 2600 | Film Thickness Measurement | - |
| 151957 |
|
Veeco / Digital Instruments VX 210 |
Veeco / Digital Instruments | VX 210 | - | - |
| 151959 |
|
KLA RS 55 TCA |
KLA | RS 55 TCA | - | - |
| 151970 |
|
Thermo Fisher Scientific / FEI Verios 460 L |
Thermo Fisher Scientific / FEI | Verios 460 L | - | - |
| 151958 |
|
KLA RS 75 TCA Resistivity System |
KLA | RS 75 TCA | Resistivity System | - |
| 151962 |
|
ONTO / Nanometrics Nanospec 6100 |
ONTO / Nanometrics | Nanospec 6100 | - | - |
| 151961 |
|
KLA Flexus 5410 Measurement System |
KLA | Flexus 5410 | Measurement System | - |
| 151969 |
|
Thermo Fisher Scientific / FEI Helios 460 F 1 |
Thermo Fisher Scientific / FEI | Helios 460 F 1 | - | - |
| 151968 |
|
Thermo Fisher Scientific / FEI Helios 450 HP |
Thermo Fisher Scientific / FEI | Helios 450 HP | - | - |
| 151964 |
|
ONTO / Nanometrics Nanospec 9200 Automated Film Analysis System |
ONTO / Nanometrics | Nanospec 9200 | Automated Film Analysis System | - |
| 151963 |
|
KLA Surfscan SP 1 TBI |
KLA | Surfscan SP 1 TBI | - | 12 inch |
| 151966 |
|
Applied Materials Centura AP Ultima X HDP-CVD (High-Density Plasma - Chemical Vapor Deposition) |
Applied Materials | Centura AP Ultima X | HDP-CVD (High-Density Plasma - Chemical Vapor Deposition) | 12 inch |
| 151965 |
|
KLA P 22 Surface Profilometer |
KLA | P 22 | Surface Profilometer | - |
| 151954 |
|
SUSS MA 6 Mask Aligner |
SUSS | MA 6 | Mask Aligner | - |
| 151951 |
|
Advantest T 5588 Tester |
Advantest | T 5588 | Tester | - |
| 151950 |
|
TechWing TW 350 H Memory Test Handler |
TechWing | TW 350 H | Memory Test Handler | - |
| 151947 |
|
Nikon Optistation 3100 Wafer Inspection System |
Nikon | Optistation 3100 | Wafer Inspection System | - |
| 151946 |
|
KLA Candela 8520 Wafer Inspection System |
KLA | Candela 8520 | Wafer Inspection System | 6 inch |
| 151938 |
|
Hwan Woong Centering Machine |
Hwan Woong | - | Centering Machine | - |
| 151937 |
|
Kyoritsu GNH 2 80 PAS Milling Machine |
Kyoritsu | GNH 2 80 PAS | Milling Machine | - |