Hitachi S 4700 Type I Cold Field Emission Gun Scanning Electron Microscope (Cold FEG SEM)
Asset # :
60685
Equipment Make:
Hitachi
Equipment Model:
S 4700
Type:
Type I Cold Field Emission Gun Scanning Electron Microscope (Cold FEG-SEM)
Wafer Size:
Equipment Configuration:
– Specimen stage: manual stage
– Imaging modes: (2) SE Detectors
– Resolution: 1.5 nm at 15 kV, 2.1 nm at 1 kV
– Accelerating voltage: 0.5 kV to 30 kV (in 100 V steps)
– Operating system: Windows 95
Equipment Pictures:
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Added: July 6, 2021
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Views: 397