Bruker D 8 Fabline X ray Diffractometer

– High Brightness (2KW) Bruker Rotating Anode HB-TXS
– SMIF System: Spartan EFEM dual load port for 300mm wafers (2) Brooks Automation
– Handler System: UMC 300 wafer stage with short tracks on primary side
– Options: Primary optics for micro diffraction