Applied Materials Opal 7830 Si Critical Dimension – Scanning Electron Microscopy (CD SEM)
Asset # :
50366
Equipment Make:
Applied Materials
Equipment Model:
Opal 7830 Si
Type:
Critical Dimension - Scanning Electron Microscopy (CD-SEM)
Wafer Size:
Equipment Configuration:
Equipment Pictures:
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Added: September 13, 2019
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Views: 1895