Hitachi S 300 FBN Focused Ion Beam – Scanning Electron Microscope (FIB SEM) Sold
Asset # :
48669
Equipment Make:
Hitachi
Equipment Model:
S 300 FBN
Type:
FIB-SEM
Wafer Size:
6"
Equipment Configuration:
Equipment Pictures:
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Added: October 9, 2020
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Views: 1521