FEI Quanta 200 3D Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) Sold

Asset # : 32550
Equipment Make: FEI
Equipment Model: Quanta 200
Type: 3D Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM)
Wafer Size:
Equipment Configuration:

Not Included:
Manual User Interface, Cryo prep system, Support computer, Omniprobe 200 Manipulator, Peltier Heating-cooling stage

Included: Magnum ion column, W-filament thermionic SEM, 2 GISes, Automation software: AutoTEM, Auto Slice and View and AutoFIB, 3 vacuum modes, Was under service contract for its entire life (2004)

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  • Added: May 25, 2018

  • Views: 36

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