English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
18044 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 145097 |
|
Scientech 362 Power / Energy Meter |
Scientech | 362 | Power / Energy Meter | - |
| 145096 |
|
Tektronix 2467 Oscilloscope |
Tektronix | 2467 | Oscilloscope | - |
| 145095 |
|
Keithley 616 Electrometer |
Keithley | 616 | Electrometer | - |
| 145094 |
|
Teledyne Hastings 760 Vacuum Gauge |
Teledyne Hastings | 760 | Vacuum Gauge | - |
| 145093 |
|
Teledyne Hastings 760 Vacuum Gauge |
Teledyne Hastings | 760 | Vacuum Gauge | - |
| 145092 |
|
HP / Agilent / Verigy 4276 A LCZ Meter |
HP / Agilent / Verigy | 4276 A | LCZ Meter | - |
| 145091 |
|
International C VP 5000 Video Processing Center |
International C | VP 5000 | Video Processing Center | - |
| 145090 |
|
Fast Forward Video F 200 Time Code Generator / Reader |
Fast Forward Video | F 200 | Time Code Generator / Reader | - |
| 145089 |
|
Edwards 1105 Vaccum Gauge Controller |
Edwards | 1105 | Vaccum Gauge Controller | - |
| 145087 |
|
Point Electronic DISS 5 Controller |
Point Electronic | DISS 5 | Controller | - |
| 145086 |
|
Omniprobe Micromunipulator Control Unit |
Omniprobe | - | Micromunipulator Control Unit | - |
| 145085 |
|
Newport 2835 C Multifunction Optical Meter |
Newport | 2835 C | Multifunction Optical Meter | - |
| 144952 |
|
Thermo Fisher Scientific / FEI OptiFIB Taipan G 2 FIB (Focused Ion Beam) |
Thermo Fisher Scientific / FEI | OptiFIB Taipan G 2 | FIB (Focused Ion Beam) | - |
| 144951 |
|
Thermo Fisher Scientific / FEI OptiFIB Taipan G 2 FIB (Focused Ion Beam) |
Thermo Fisher Scientific / FEI | OptiFIB Taipan G 2 | FIB (Focused Ion Beam) | - |
| 144950 |
|
Thermo Fisher Scientific / FEI OptiFIB Taipan G 2 FIB (Focused Ion Beam) |
Thermo Fisher Scientific / FEI | OptiFIB Taipan G 2 | FIB (Focused Ion Beam) | - |
| 144949 |
|
Dell OptiPlex 3050 PC |
Dell | OptiPlex 3050 | PC | - |
| 144948 |
|
Thermo Fisher Scientific / FEI OptiFIB Taipan G 2 + FIB (Focused Ion Beam) |
Thermo Fisher Scientific / FEI | OptiFIB Taipan G 2 + | FIB (Focused Ion Beam) | - |
| 144947 |
|
Thermo Fisher Scientific / FEI OptiFIB Taipan G 2 FIB (Focused Ion Beam) |
Thermo Fisher Scientific / FEI | OptiFIB Taipan G 2 | FIB (Focused Ion Beam) | - |
| 144946 |
Sold
|
Micro-Vu Vertex 410 Measuring Center |
Micro-Vu | Vertex 410 | Measuring Center | - |
| 144927 |
|
Powatec P 200 Manual Wafer Mounter |
Powatec | P 200 | Manual Wafer Mounter | - |
| 144920 |
|
Moore Nanotechnology 250 UPL Diamond Turning Lathe |
Moore Nanotechnology | 250 UPL | Diamond Turning Lathe | - |
| 144915 |
|
Sycon STC 2000 A Thickness Rate Controller |
Sycon | STC 2000 A | Thickness Rate Controller | - |
| 144917 |
|
Nordson / Dage 4000 Bond Tester |
Nordson / Dage | 4000 | Bond Tester | - |
| 144912 |
|
Keysight N 5225 B |
Keysight | N 5225 B | - | - |
| 144904 |
|
Tokyo Seimitsu UF 60 Prober |
Tokyo Seimitsu | UF 60 | Prober | - |
| 144903 |
|
Tokyo Seimitsu UF 60 A Prober |
Tokyo Seimitsu | UF 60 A | Prober | - |
| 144902 |
|
Tokyo Seimitsu UF 60 Prober |
Tokyo Seimitsu | UF 60 | Prober | - |
| 144881 |
|
Hanwha ML 20 |
Hanwha | ML 20 | - | - |
| 144880 |
|
Hanwha ML 20 |
Hanwha | ML 20 | - | - |
| 144879 |
|
Hanwha ML 20 |
Hanwha | ML 20 | - | - |
| 144878 |
|
Hanwha SL 20 H |
Hanwha | SL 20 H | - | - |
| 144869 |
|
GenRad ICT (In Circuit Tester) |
GenRad | - | ICT (In Circuit Tester) | - |
| 144858 |
|
Iwasaki SUV W 161 UV Solar Environmental Test Chamber |
Iwasaki | SUV W 161 | UV Solar Environmental Test Chamber | - |
| 144865 |
|
Spec SBX 4-30 Wet Process |
Spec | SBX 4-30 | Wet Process | - |
| 144864 |
|
Intelligent Micro Patterning SF 100 Direct Writer |
Intelligent Micro Patterning | SF 100 | Direct Writer | - |
| 144863 |
|
Wentworth MP 2300 Probe Station |
Wentworth | MP 2300 | Probe Station | - |
| 144862 |
|
Sopra GES 5 E Ellipsometer |
Sopra | GES 5 E | Ellipsometer | - |
| 144861 |
|
BMR HIDEP PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
BMR | HIDEP | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | - |
| 144860 |
|
CleanAir Solutions Acid Bench |
CleanAir Solutions | - | Acid Bench | - |
| 144859 |
|
Bruker Innova AFM Controller (Atomic Force Microscope) |
Bruker | Innova | AFM Controller (Atomic Force Microscope) | - |
| 144857 |
|
Veeco DiInnova 840 012 711 AFM (Atomic Force Microscope) |
Veeco | DiInnova 840 012 711 | AFM (Atomic Force Microscope) | - |
| 144843 |
|
Disco DFG 841 Automatic Grinder |
Disco | DFG 841 | Automatic Grinder | 8 inch |
| 144831 |
|
Perkin Elmer Lambda 1050 UV-VIS-NIR Spectrophotometer (Ultra Violet Visible Near Infrared) |
Perkin Elmer | Lambda 1050 | UV-VIS-NIR Spectrophotometer (Ultra Violet Visible Near Infrared) | - |
| 144807 |
|
Myron 1012 RO Water Purification System |
Myron | 1012 RO | Water Purification System | - |
| 144803 |
|
Fong Ho Machinery FHC 75 EA Grinder |
Fong Ho Machinery | FHC 75 EA | Grinder | - |
| 144801 |
|
Kent SGS 1020 AHD Surface Grinder |
Kent | SGS 1020 AHD | Surface Grinder | - |
| 144800 |
|
KLA Surfscan 6100 Wafer Inspection System |
KLA | Surfscan 6100 | Wafer Inspection System | - |
| 144799 |
|
Speedfam Lapper / Polisher |
Speedfam | - | Lapper / Polisher | - |