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of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 68617 |
|
Kurt J Lesker KJL 4500 Multiple Ion Gauge Controller |
Kurt J Lesker | KJL 4500 | Multiple Ion Gauge Controller | - |
| 68616 |
|
Baileigh WR 84 V-ATC Router Table |
Baileigh | WR 84 V-ATC | Router Table | - |
| 68615 |
|
Thermo RCDM 3 CDM |
Thermo | RCDM 3 | CDM | - |
| 68613 |
Sold
|
Disco DFD 6341 Automatic Dicing Saw |
Disco | DFD 6341 | Automatic Dicing Saw | - |
| 68612 |
Sold
|
Okuma LU 15 Lathe |
Okuma | LU 15 | Lathe | - |
| 68611 |
Sold
|
Okuma LU 15 M Lathe |
Okuma | LU 15 M | Lathe | - |
| 68610 |
|
BTU Pyramax 125 N Reflow Oven |
BTU | Pyramax 125 N | Reflow Oven | - |
| 68609 |
|
BTU Pyramax 150 N Reflow Oven |
BTU | Pyramax 150 N | Reflow Oven | - |
| 68608 |
|
BTU Pyramax 150 N Reflow Oven |
BTU | Pyramax 150 N | Reflow Oven | - |
| 68607 |
Sold
|
SCREEN / DNS SK 2000 Coater / Developer |
SCREEN / DNS | SK 2000 | Coater / Developer | - |
| 68606 |
|
Applied Materials Centura WxZ Optima MCVD |
Applied Materials | Centura WxZ Optima | MCVD | - |
| 68604 |
|
SST MV 2200 Vacuum Furnace |
SST | MV 2200 | Vacuum Furnace | - |
| 68603 |
|
SST DAP 2200 Vacuum Furnace |
SST | DAP 2200 | Vacuum Furnace | - |
| 68602 |
|
Changluo LEDA 8 F Wafer Needle Tester |
Changluo | LEDA 8 F | Wafer Needle Tester | - |
| 68600 |
|
Keithley 2611 A |
Keithley | 2611 A | - | - |
| 68599 |
|
Whit Technology LFP 6000 PEC Flip Chip Point Measuring Machine |
Whit Technology | LFP 6000 | PEC Flip Chip Point Measuring Machine | - |
| 68598 |
|
KLA / ICOS WI 2280 Inspection System |
KLA / ICOS | WI 2280 | Inspection System | - |
| 68597 |
|
Chroma 58173 FC PEC |
Chroma | 58173 FC | PEC | - |
| 68596 |
|
Chroma 58173 FC |
Chroma | 58173 FC | - | - |
| 68595 |
|
Chroma 58173 FC LED Flip Chip Tester |
Chroma | 58173 FC | LED Flip Chip Tester | - |
| 68594 |
|
Chroma 58173 FC LED Flip Chip Tester |
Chroma | 58173 FC | LED Flip Chip Tester | - |
| 68593 |
|
Chroma 58173 FC PEC Lower Receiver |
Chroma | 58173 FC | PEC Lower Receiver | - |
| 68592 |
|
Chroma 58173 FC LED Flip Chip Tester |
Chroma | 58173 FC | LED Flip Chip Tester | - |
| 68591 |
|
Chroma 58173 F LED Tester |
Chroma | 58173 F | LED Tester | - |
| 68590 |
|
Olympus BX 51 M Microscope |
Olympus | BX 51 M | Microscope | - |
| 68589 |
|
Nikon SMZ 745 Stereo Microscope |
Nikon | SMZ 745 | Stereo Microscope | - |
| 68588 |
|
Bruker D 8 Discover Analytical X-ray Diffractometer |
Bruker | D 8 Discover | Analytical X-ray Diffractometer | - |
| 68587 |
|
Veeco K 465 Reactor Cart |
Veeco | K 465 | Reactor Cart | - |
| 68586 |
|
Veeco K 465 Reactor Cart |
Veeco | K 465 | Reactor Cart | - |
| 68585 |
|
Veeco K 465 Reactor Cart |
Veeco | K 465 | Reactor Cart | - |
| 68584 |
|
Nikon SMZ 800 & ACC Microscope |
Nikon | SMZ 800 & ACC | Microscope | - |
| 68583 |
|
Nikon SMZ 800 & ACC Microscope |
Nikon | SMZ 800 & ACC | Microscope | - |
| 68582 |
|
Nikon SMZ 800 & ACC Microscope |
Nikon | SMZ 800 & ACC | Microscope | - |
| 68581 |
|
Nikon SMZ 800 & ACC Electron Microscope |
Nikon | SMZ 800 & ACC | Electron Microscope | - |
| 68580 |
|
Wangsi Technology P 80 C 4 Automatic Sampling Test Machine |
Wangsi Technology | P 80 C 4 | Automatic Sampling Test Machine | - |
| 68579 |
|
Wangsi Technology P 80 C 4 Automatic Wafer Prober |
Wangsi Technology | P 80 C 4 | Automatic Wafer Prober | - |
| 68578 |
|
Wangsi Technology P 80 C 4 Automatic Wafer Prober |
Wangsi Technology | P 80 C 4 | Automatic Wafer Prober | - |
| 68577 |
|
Lam / SEZ RST 304 |
Lam / SEZ | RST 304 | - | - |
| 68566 |
Sold
|
Lam / Novellus Concept Two Speed Chamber |
Lam / Novellus | Concept Two Speed | Chamber | - |
| 68562 |
|
K&S 8028 PPS Wire Bonder |
K&S | 8028 PPS | Wire Bonder | - |
| 68561 |
|
Miura ST-015 EL Autoclave |
Miura | ST-015 EL | Autoclave | - |
| 68560 |
|
IWT W 200 Parts Washer |
IWT | W 200 | Parts Washer | - |
| 68559 |
|
Allen Bradley SLC 500 |
Allen Bradley | SLC 500 | - | - |
| 68558 |
|
Tesa Reflex Micro Hite 3 D CMM (Coordinate Measuring Machine) |
Tesa | Reflex Micro Hite 3 D | CMM (Coordinate Measuring Machine) | - |
| 68550 |
|
Hitachi S 570 SEM (Scanning Electron Microscope) |
Hitachi | S 570 | SEM (Scanning Electron Microscope) | - |
| 68546 |
|
Agilent Test Equipment |
Agilent | - | Test Equipment | - |
| 68538 |
Sold
|
Nord Engineering Spindle |
Nord Engineering | - | Spindle | - |
| 68537 |
Sold
|
Strasbaugh 6 DE 6 Spindle |
Strasbaugh | 6 DE 6 | Spindle | - |