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25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 83977 |
|
Adtec AX 1000 III 27 M LC GT |
Adtec | AX 1000 III 27 M LC GT | - | - |
| 83976 |
|
Adtec AMV 2000 AMT MB Power Supply |
Adtec | AMV 2000 AMT | MB Power Supply | - |
| 83975 |
|
Adtec AMV 1000 AA |
Adtec | AMV 1000 AA | - | - |
| 83974 |
|
Lam Etcher |
Lam | - | Etcher | - |
| 83972 |
|
Lam 9600 Dry Etcher |
Lam | 9600 | Dry Etcher | - |
| 83971 |
|
Lam 9400 Etcher |
Lam | 9400 | Etcher | - |
| 83966 |
|
Asyst UTXN 1310 Controller |
Asyst | UTXN 1310 | Controller | - |
| 83965 |
|
Nikon NSR 2205 i 14 E 2 i-Line Stepper |
Nikon | NSR 2205 i 14 E 2 | i-Line Stepper | - |
| 83964 |
|
Lam Etcher |
Lam | - | Etcher | - |
| 83963 |
|
Hitachi S 4700 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 83962 |
Sold
|
Agilent / Varian 7500 A ICP-MS (Inductively Coupled Plasma - Mass Spectrometer) |
Agilent / Varian | 7500 A | ICP-MS (Inductively Coupled Plasma - Mass Spectrometer) | - |
| 83958 |
|
Nikon NSR S 204 B Step and Repeat System |
Nikon | NSR S 204 B | Step and Repeat System | - |
| 83957 |
|
Strasbaugh 7 AF Back Grinder |
Strasbaugh | 7 AF | Back Grinder | - |
| 83956 |
|
EVG Gemini Bonder |
EVG | Gemini | Bonder | - |
| 83953 |
|
Yes III HMDS Vapor Prime / Vacuum Oven |
Yes | III | HMDS Vapor Prime / Vacuum Oven | - |
| 83952 |
|
Takano Vi 5301 M Patterned Wafer Visual Inspection System |
Takano | Vi 5301 M | Patterned Wafer Visual Inspection System | - |
| 83951 |
|
Takano Vi 4307 M/C Patterned Wafer Visual Inspection System |
Takano | Vi 4307 M/C | Patterned Wafer Visual Inspection System | - |
| 83950 |
|
Nikon Optistation 3100 Wafer Inspection System |
Nikon | Optistation 3100 | Wafer Inspection System | - |
| 83949 |
|
Takano Vi 4207 R/C Patterned Wafer Visual Inspection System |
Takano | Vi 4207 R/C | Patterned Wafer Visual Inspection System | 8 inch |
| 83948 |
|
KLA Surfscan 6420 Particle Defect System |
KLA | Surfscan 6420 | Particle Defect System | 8 inch |
| 83947 |
|
KLA Surfscan 6200 Particle Defect System |
KLA | Surfscan 6200 | Particle Defect System | 8 inch |
| 83946 |
|
KLA Surfscan SP 1 DLS Particle Defect System |
KLA | Surfscan SP 1 DLS | Particle Defect System | - |
| 83945 |
|
KLA UV 1050 Thin Film Measurement System |
KLA | UV 1050 | Thin Film Measurement System | 8 inch |
| 83944 |
|
KLA RS 55 TC Four Point Probe |
KLA | RS 55 TC | Four Point Probe | 8 inch |
| 83943 |
|
SUSS MJB 3 Mask Aligner |
SUSS | MJB 3 | Mask Aligner | - |
| 83942 |
|
SUSS MA 6 Mask Aligner |
SUSS | MA 6 | Mask Aligner | 6 inch |
| 83941 |
|
EVG EV 501 Wafer Bonder |
EVG | EV 501 | Wafer Bonder | 2, 3, 4, 5, 6, 12 inch |
| 83940 |
|
Disco DFD 321 Automatic Dicing Saw |
Disco | DFD 321 | Automatic Dicing Saw | 6 inch |
| 83939 |
|
MRL Cyclone Atmospheric Furnace |
MRL | - | Cyclone Atmospheric Furnace | - |
| 83938 |
|
KLA ASET F 5 X |
KLA | ASET F 5 X | - | - |
| 83937 |
|
KLA Archer AIM+ Overlay System |
KLA | Archer AIM+ | Overlay System | 8, 12 inch |
| 83936 |
|
Takano Altax 300 ex Surface Particle Inspection |
Takano | Altax 300 ex | Surface Particle Inspection | - |
| 83935 |
|
KLA Alpha Step IQ Surface Profilometer |
KLA | Alpha Step IQ | Surface Profilometer | - |
| 83934 |
|
KLA Alpha Step 200 Profilometer |
KLA | Alpha Step 200 | Profilometer | - |
| 83933 |
|
OAI 806 Mask Aligner |
OAI | 806 | Mask Aligner | 6 inch |
| 83932 |
|
EVG 620 Mask Aligner |
EVG | 620 | Mask Aligner | 6 inch |
| 83931 |
|
EVG 520 IS Wafer Bonder |
EVG | 520 IS | Wafer Bonder | 8 inch |
| 83930 |
|
EVG 520 IS Wafer Bonder |
EVG | 520 IS | Wafer Bonder | 2, 3, 4, 5, 6, 12 inch |
| 83929 |
|
Teradyne J 750 EX HD Tester |
Teradyne | J 750 EX HD | Tester | - |
| 83928 |
Sold
|
Advantest T 5588 Memory Tester |
Advantest | T 5588 | Memory Tester | - |
| 83927 |
Sold
|
Jeol JEM 2100 TEM (Transmission Electron Microscope) |
Jeol | JEM 2100 | TEM (Transmission Electron Microscope) | - |
| 83925 |
|
QC-S Liquid Chemical Sampling Unit Vacuum Pump |
- | - | QC-S Liquid Chemical Sampling Unit Vacuum Pump | - |
| 83924 |
|
RION KS 40 B Liquid Particle Counter Sensor |
RION | KS 40 B | Liquid Particle Counter Sensor | - |
| 83923 |
|
RION KS 40 B Liquid Particle Counter Sensor |
RION | KS 40 B | Liquid Particle Counter Sensor | - |
| 83922 |
|
Lovibond Tintometer |
Lovibond | - | Tintometer | - |
| 83921 |
|
Thermo Scientific UltiMate 3000 High Performance Liquid Chromatography |
Thermo Scientific | UltiMate 3000 | High Performance Liquid Chromatography | - |
| 83920 |
|
Atago NAR 3 T Refractometer |
Atago | NAR 3 T | Refractometer | - |
| 83919 |
|
Atago RX 5000 Refractometer |
Atago | RX 5000 | Refractometer | - |