25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 82627 |
|
KLA / Leica INM 100 + INS 10 Macro Inspection |
KLA / Leica | INM 100 + INS 10 | Macro Inspection | 6 inch |
| 82626 |
|
KLA HRP 340 Surface Profilometer |
KLA | HRP 340 | Surface Profilometer | - |
| 82625 |
|
KLA / Leica Ergolux AFM (Atomic Force Microscope) |
KLA / Leica | Ergolux | AFM (Atomic Force Microscope) | 6 inch |
| 82624 |
|
KLA Archer 200 AIM Overlay System |
KLA | Archer 200 AIM | Overlay System | - |
| 82623 |
|
KLA Aleris HX 8500 Ellipsometry Measurement tool |
KLA | Aleris HX 8500 | Ellipsometry Measurement tool | - |
| 82622 |
|
KLA 8250 XP CD-SEM (Critical Dimension Scanning Electron Microscope) |
KLA | 8250 XP | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 82621 |
|
KLA 8250 CD-SEM (Critical Dimension Scanning Electron Microscope) |
KLA | 8250 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 82620 |
|
Kawasaki Controller |
Kawasaki | - | Controller | - |
| 82619 |
|
Jeol JEM 3200 FS FE-SEM (Field Emission Scanning Electron Microscope) |
Jeol | JEM 3200 FS | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 82618 |
|
Internova ICLS RTX Mask SMIF |
Internova | ICLS RTX | Mask SMIF | - |
| 82617 |
|
Internova ICLS RTX Mask SMIF |
Internova | ICLS RTX | Mask SMIF | - |
| 82616 |
|
Hitachi S 5500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 82615 |
|
Hitachi S 5500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 82614 |
|
Hitachi RS 6000 Resistivity Measurement |
Hitachi | RS 6000 | Resistivity Measurement | - |
| 82613 |
|
Hitachi RS 6000 Resistivity Measurement |
Hitachi | RS 6000 | Resistivity Measurement | - |
| 82612 |
|
KLA Altair 8900 Defect Inspection System |
KLA | Altair 8900 | Defect Inspection System | 8 inch |
| 82611 |
|
Imtec Star 2000 Primer ATV |
Imtec | Star 2000 | Primer ATV | - |
| 82610 |
|
Hyer Photon HPS 376 KT Laser Scriber |
Hyer Photon | HPS 376 KT | Laser Scriber | 6 inch |
| 82609 |
|
Huber Unistat 825 |
Huber | Unistat 825 | - | - |
| 82608 |
|
Hitachi S 5200 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5200 | FE-SEM (Field Emission Scanning Electron Microscope) | 8 inch |
| 82607 |
|
Hitachi RS 5000 Resistivity Measurement |
Hitachi | RS 5000 | Resistivity Measurement | - |
| 82606 |
|
Hitachi M 511 AE Dry Etcher |
Hitachi | M 511 AE | Dry Etcher | 8 inch |
| 82605 |
|
Hitachi M 501 AW Metal Etcher |
Hitachi | M 501 AW | Metal Etcher | 6 inch |
| 82604 |
|
Hitachi HD 2300 STEM (Scanning Transmission Electron Microscope) |
Hitachi | HD 2300 | STEM (Scanning Transmission Electron Microscope) | - |
| 82603 |
|
Hitachi DM 421 P Etcher |
Hitachi | DM 421 P | Etcher | 8 inch |
| 82602 |
|
Hirox Microscope |
Hirox | - | Microscope | - |
| 82601 |
|
Hitachi CG 4100 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4100 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 82600 |
|
Hitachi CG 4100 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4100 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 82598 |
|
Teradyne / Eagle ETS 364 Tester |
Teradyne / Eagle | ETS 364 | Tester | - |
| 82596 |
|
LTX / Credence Quartet Tester |
LTX / Credence | Quartet | Tester | - |
| 82595 |
|
Multitest MT 9928 Handler |
Multitest | MT 9928 | Handler | - |
| 82594 |
|
Multitest MT 9928 Handler |
Multitest | MT 9928 | Handler | - |
| 82593 |
Sold
|
Teradyne / Eagle ETS 364 Tester |
Teradyne / Eagle | ETS 364 | Tester | - |
| 82592 |
Sold
|
Teradyne / Eagle ETS 364 Tester |
Teradyne / Eagle | ETS 364 | Tester | - |
| 82591 |
|
Hanwha STF ED 20 TH Direct Tray Feeder |
Hanwha | STF ED 20 TH | Direct Tray Feeder | - |
| 82590 |
Sold
|
Sonoscan D 9000 Scanning Acoustic Microscope |
Sonoscan | D 9000 | Scanning Acoustic Microscope | - |
| 82589 |
|
Hanwha STF ED 20 TH Direct Tray Feeder |
Hanwha | STF ED 20 TH | Direct Tray Feeder | - |
| 82588 |
|
Zeiss Supra 55 VP SEM (Scanning Electron Microscope) |
Zeiss | Supra 55 VP | SEM (Scanning Electron Microscope) | - |
| 82587 |
|
Tel Precio XL Prober |
Tel | Precio XL | Prober | - |
| 82585 |
|
Disco DFD 6360 Automatic Dicing Saw |
Disco | DFD 6360 | Automatic Dicing Saw | - |
| 82584 |
|
Tel Precio Automatic Wafer Prober |
Tel | Precio | Automatic Wafer Prober | - |
| 82583 |
|
Shin Etsu 300 EX S 281 Aquaproof FOUP Wafer Shipping Boxes |
Shin Etsu | 300 EX S 281 Aquaproof | FOUP Wafer Shipping Boxes | - |
| 82582 |
|
Teradyne / Nextest Magnum II SV Tester |
Teradyne / Nextest | Magnum II SV | Tester | - |
| 82581 |
|
Teradyne / Nextest Magnum II PV Test System |
Teradyne / Nextest | Magnum II PV | Test System | - |
| 82580 |
|
SUSS MA 200 Mask Aligner |
SUSS | MA 200 | Mask Aligner | - |
| 82579 |
|
Exatron 202 Tape & Reel |
Exatron | 202 | Tape & Reel | - |
| 82578 |
|
Electroglas EG 6000 Prober |
Electroglas | EG 6000 | Prober | - |
| 82577 |
|
Teradyne / Eagle ETS 88 Duo Tester |
Teradyne / Eagle | ETS 88 Duo | Tester | - |
English
Chinese (Traditional)
French
German
Japanese
Korean