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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 153239 |
|
PSK Surpa N Asher / Stripper |
PSK | Surpa N | Asher / Stripper | 12 inch |
| 153238 |
|
Ontrak DSS 200 Series II Wafer Scrubber |
Ontrak | DSS 200 Series II | Wafer Scrubber | 6 inch |
| 153237 |
|
ONTO / Rudolph / August NSX 220 Macro Defect |
ONTO / Rudolph / August | NSX 220 | Macro Defect | 6 inch |
| 153236 |
|
ONTO / Rudolph / August NSX 105 Spare Parts |
ONTO / Rudolph / August | NSX 105 | Spare Parts | 8 inch |
| 153235 |
|
ONTO / Rudolph / August CV 9800 Wafer Carrier Inspection |
ONTO / Rudolph / August | CV 9800 | Wafer Carrier Inspection | 8 inch |
| 153234 |
|
ONTO / Rudolph Waferscan 8000 Macro Defect |
ONTO / Rudolph | Waferscan 8000 | Macro Defect | 8 inch |
| 153233 |
|
ONTO / Rudolph Ultra II Ellipsometer |
ONTO / Rudolph | Ultra II | Ellipsometer | 12 inch |
| 153232 |
|
ONTO / Rudolph AXI 935 Macro Defect |
ONTO / Rudolph | AXI 935 | Macro Defect | 12 inch |
| 153231 |
|
ONTO / Nanometrics / Accent / Bio-Rad Atlas XP Film Thickness Measurement System |
ONTO / Nanometrics / Accent / Bio-Rad | Atlas XP | Film Thickness Measurement System | 12 inch |
| 153230 |
|
ONTO / Nanometrics / Accent / Bio-Rad Atlas III Critical Dimension (CD) Measurement |
ONTO / Nanometrics / Accent / Bio-Rad | Atlas III | Critical Dimension (CD) Measurement | 12 inch |
| 153229 |
|
ONTO / Nanometrics RPMBlue FS Mass Spectrometer |
ONTO / Nanometrics | RPMBlue FS | Mass Spectrometer | 12 inch |
| 153228 |
|
ONTO / Nanometrics NanoSpec 8000 X Film Thickness Measurement System |
ONTO / Nanometrics | NanoSpec 8000 X | Film Thickness Measurement System | 6 inch |
| 153227 |
|
Olympus MX 51 F Microscope |
Olympus | MX 51 F | Microscope | 6 inch |
| 153226 |
|
Olympus BH 2 UMA Microscope |
Olympus | BH 2 UMA | Microscope | 6 inch |
| 153224 |
|
Novellus / Varian 3290 STQ PVD (Physical Vapor Deposition) |
Novellus / Varian | 3290 STQ | PVD (Physical Vapor Deposition) | 6 inch |
| 153223 |
|
Nova V 2600 CMP (Chemical Mechanical Polisher) |
Nova | V 2600 | CMP (Chemical Mechanical Polisher) | 12 inch |
| 153222 |
|
Nissin IMP HEAT Medium Current Implanter |
Nissin | IMP HEAT | Medium Current Implanter | 6 inch |
| 153221 |
|
Nissin Exceed 9600 A Medium Current Implanter |
Nissin | Exceed 9600 A | Medium Current Implanter | 6 inch |
| 153220 |
|
Nissin Exceed 3000 AH Medium Current Implanter |
Nissin | Exceed 3000 AH | Medium Current Implanter | 6 inch |
| 153219 |
|
Nikon Optistation V Optical Review System |
Nikon | Optistation V | Optical Review System | 8 inch |
| 153218 |
|
Nikon Optistation 7 Optical Review System |
Nikon | Optistation 7 | Optical Review System | 12 inch |
| 153217 |
|
Nikon Optiphot 200 / NWL 851 Microscope |
Nikon | Optiphot 200 / NWL 851 | Microscope | 8 inch |
| 153216 |
|
Nikon Optiphot 200 / NWL 200 Microscope |
Nikon | Optiphot 200 / NWL 200 | Microscope | 8 inch |
| 153215 |
|
Nikon Optiphot 200 Microscope |
Nikon | Optiphot 200 | Microscope | 8 inch |
| 153214 |
|
Nikon Optiphot 100 Microscope |
Nikon | Optiphot 100 | Microscope | 8 inch |
| 153213 |
|
Nikon NWL 860 Microscope |
Nikon | NWL 860 | Microscope | 8 inch |
| 153212 |
|
Nikon NWL 860 Microscope |
Nikon | NWL 860 | Microscope | 8 inch |
| 153211 |
|
Nikon NWL 851 Microscope |
Nikon | NWL 851 | Microscope | 8 inch |
| 153210 |
|
Nikon NWL 200 Microscope |
Nikon | NWL 200 | Microscope | 6 inch |
| 153209 |
|
Nikon NSR S 621 D Immersion Scanner |
Nikon | NSR S 621 D | Immersion Scanner | 12 inch |
| 153208 |
|
Nikon NSR S 205 C Scanner |
Nikon | NSR S 205 C | Scanner | 12 inch |
| 153207 |
|
Nikon NSR 2205 i 12 D i-Line Stepper |
Nikon | NSR 2205 i 12 D | i-Line Stepper | 8 inch |
| 153206 |
|
Nikon NSR 2205 i 12 D i-Line Stepper |
Nikon | NSR 2205 i 12 D | i-Line Stepper | 6 inch |
| 153205 |
|
Nikon N SISV R Optical Review System |
Nikon | N SISV R | Optical Review System | 12 inch |
| 153204 |
|
Nikon Eclipse L 200 ND Microscope |
Nikon | Eclipse L 200 ND | Microscope | 6 inch |
| 153203 |
|
Nikon Eclipse L 200 N / NWL 200 Microscope |
Nikon | Eclipse L 200 N / NWL 200 | Microscope | 8 inch |
| 153202 |
|
Nicolet ECO 1000 S FTIR (Fourier Transform Infrared) |
Nicolet | ECO 1000 S | FTIR (Fourier Transform Infrared) | 8 inch |
| 153201 |
|
Nada Technologies N 4 X Wafer Sorter |
Nada Technologies | N 4 X | Wafer Sorter | 6 inch |
| 153200 |
|
MPI Skywalker S 6 Wafer Prober |
MPI | Skywalker S 6 | Wafer Prober | 6 inch |
| 153199 |
|
Modular Process Technology RTP 600 XP RTP (Rapid Thermal Process) |
Modular Process Technology | RTP 600 XP | RTP (Rapid Thermal Process) | 6 inch |
| 153198 |
|
Mitutoyo VL 50 S Height Measurement |
Mitutoyo | VL 50 S | Height Measurement | 6 inch |
| 153197 |
|
Mitutoyo FS 110 Reticle Inspection |
Mitutoyo | FS 110 | Reticle Inspection | 8 inch |
| 153196 |
|
Micromanipulator P 300 J Wafer Prober |
Micromanipulator | P 300 J | Wafer Prober | 8 inch |
| 153195 |
|
Micromanipulator MM 8060 Wafer Prober |
Micromanipulator | MM 8060 | Wafer Prober | 8 inch |
| 153194 |
|
Micromanipulator 4060 Wafer Prober |
Micromanipulator | 4060 | Wafer Prober | 8 inch |
| 153193 |
|
MEI Revolution Radial 5 Batch Wafer Processing |
MEI | Revolution Radial 5 | Batch Wafer Processing | 6 inch |
| 153192 |
|
MEI Advancer Gemini 150 Batch Wafer Processing |
MEI | Advancer Gemini 150 | Batch Wafer Processing | 6 inch |
| 153191 |
|
Mattson Suprema CXP Asher / Stripper |
Mattson | Suprema CXP | Asher / Stripper | 12 inch |