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25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 129052 |
|
Electroglas Horizon 4080 X Prober |
Electroglas | Horizon 4080 X | Prober | - |
| 129051 |
|
Electroglas Horizon 4080 X Prober |
Electroglas | Horizon 4080 X | Prober | - |
| 129037 |
|
JPSA IX 260 LED Laser Lift-off |
JPSA | IX 260 | LED Laser Lift-off | - |
| 129032 |
Sold
|
Oxford Plasmalab 100 ICP 180 |
Oxford | Plasmalab 100 ICP 180 | - | - |
| 129016 |
Sold
|
Oxford Plasmalab 800 Plus RIE (Reactive Ion Etcher) |
Oxford | Plasmalab 800 Plus | RIE (Reactive Ion Etcher) | - |
| 129004 |
|
FSI Mercury MP Batch Spray Cleaning System |
FSI | Mercury MP | Batch Spray Cleaning System | 8 inch |
| 129007 |
|
Camtek Falcon 630 Automatic Wafer Optical Inspection System |
Camtek | Falcon 630 | Automatic Wafer Optical Inspection System | - |
| 129003 |
|
FSI Mercury MP Batch Spray Cleaning System |
FSI | Mercury MP | Batch Spray Cleaning System | 8 inch |
| 129006 |
|
KLA Surfscan 6220 Particle Defect System |
KLA | Surfscan 6220 | Particle Defect System | 8 inch |
| 129000 |
|
Zeiss LSM 880 Confocal Microscope |
Zeiss | LSM 880 | Confocal Microscope | - |
| 128994 |
|
Tel P 12 XL Water Prober |
Tel | P 12 XL | Water Prober | - |
| 128990 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 128985 |
Sold
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127578 |
|
Zygo Mark III Interferometer |
Zygo | Mark III | Interferometer | - |
| 128960 |
|
Aixtron G 5 HT MOCVD (Metal Organic Chemical Vapor Deposition) |
Aixtron | G 5 HT | MOCVD (Metal Organic Chemical Vapor Deposition) | 4, 6 inch |
| 128955 |
Sold
|
Leybold D 65 BCS Vacuum Pump |
Leybold | D 65 BCS | Vacuum Pump | - |
| 128953 |
|
Hitachi HD 2700 STEM (Scanning Transmission Electron Microscope) |
Hitachi | HD 2700 | STEM (Scanning Transmission Electron Microscope) | - |
| 128942 |
|
Chapman MP 2000 + Surface Profilometer |
Chapman | MP 2000 + | Surface Profilometer | - |
| 128940 |
|
Takaya APT 9411 SL Flying Probe |
Takaya | APT 9411 SL | Flying Probe | - |
| 128939 |
|
K&S IConn Plus Wire Bonder |
K&S | IConn Plus | Wire Bonder | - |
| 128937 |
|
Finetech Fineplacer Lambda Sub Micron Die Bonder |
Finetech | Fineplacer Lambda | Sub Micron Die Bonder | - |
| 128938 |
|
Atlas Copco ZT 37 Air Compressor |
Atlas Copco | ZT 37 | Air Compressor | - |
| 128919 |
|
KLA AIT II Defect Inspection System |
KLA | AIT II | Defect Inspection System | 8 inch |
| 128917 |
|
ONTO / Nanometrics / Accent / Bio-Rad QS 2200 A Parts |
ONTO / Nanometrics / Accent / Bio-Rad | QS 2200 A | Parts | - |
| 128898 |
Sold
|
Thermo Fisher Scientific / FEI NanoLab 450 F 1 FIB-SEM (Focused Ion Beam - Scanning Electron Microscope) |
Thermo Fisher Scientific / FEI | NanoLab 450 F 1 | FIB-SEM (Focused Ion Beam - Scanning Electron Microscope) | - |
| 128895 |
|
Hitachi SFT 9300 XRF Coating Thickness Gauge (X-ray Fluorescence) |
Hitachi | SFT 9300 | XRF Coating Thickness Gauge (X-ray Fluorescence) | - |
| 128894 |
|
Hitachi FT 9450 XRF Coating Thickness Gauge (X-ray Fluorescence) |
Hitachi | FT 9450 | XRF Coating Thickness Gauge (X-ray Fluorescence) | - |
| 128892 |
Sold
|
Advantest V 93000 C (2 CC) DUT Test Head |
Advantest | V 93000 C (2 CC) | DUT Test Head | - |
| 128890 |
Sold
|
Advantest V 93000 C (2 CC) DUT Test Head |
Advantest | V 93000 C (2 CC) | DUT Test Head | - |
| 128889 |
Sold
|
Advantest V 93000 C (2 CC) DUT Test Head |
Advantest | V 93000 C (2 CC) | DUT Test Head | - |
| 128885 |
Sold
|
Advantest V 93000 C (2 CC) DUT Test Head |
Advantest | V 93000 C (2 CC) | DUT Test Head | - |
| 128880 |
|
Disco DGP 8761 / DFM 2800 Grinder / Polisher |
Disco | DGP 8761 / DFM 2800 | Grinder / Polisher | - |
| 128876 |
|
Teradyne Ultra Flex Epsilon Boards |
Teradyne | Ultra Flex Epsilon | Boards | - |
| 128862 |
|
Oxford NordlysMax 2 EBSD Detector |
Oxford | NordlysMax 2 | EBSD Detector | - |
| 128860 |
|
Sutter P 97 Flaming Micropipette Puller |
Sutter | P 97 | Flaming Micropipette Puller | - |
| 128858 |
|
Bruker D 8 Venture XRD (X-ray Diffractometer) |
Bruker | D 8 Venture | XRD (X-ray Diffractometer) | - |
| 128857 |
|
Bruker Avance III HD+ Ascend 600 Nuclear Magnetic Resonance (NMR) Spectrometer |
Bruker | Avance III HD+ Ascend 600 | Nuclear Magnetic Resonance (NMR) Spectrometer | - |
| 128854 |
Sold
|
KLA Candela 8620 Surface Inspection System |
KLA | Candela 8620 | Surface Inspection System | - |
| 128849 |
|
Zeiss LSM 880 |
Zeiss | LSM 880 | - | - |
| 128842 |
Sold
|
Accretech / TSK AP 3000 Prober |
Accretech / TSK | AP 3000 | Prober | - |
| 128840 |
Sold
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128839 |
Sold
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128838 |
Sold
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128841 |
Sold
|
Accretech / TSK UF 3000 EX Automatic Wafer Prober |
Accretech / TSK | UF 3000 EX | Automatic Wafer Prober | - |
| 128837 |
Sold
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128836 |
Sold
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128831 |
|
Shishincron RAS 1100 C Radical Assisted Sputtering |
Shishincron | RAS 1100 C | Radical Assisted Sputtering | - |
| 128827 |
|
Advanced Energy 0190-34650-000 RF Generator |
Advanced Energy | 0190-34650-000 | RF Generator | - |