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Equipment Selection to Meet Your Needs

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25001 products

Asset #	Image	Title	Make	Model	Type	Wafer Size
145825	Sold	Agilent 34970 A Data Acquisition / Switch Unit	Agilent	34970 A	Data Acquisition / Switch Unit	-
145824	Sold	Tektronix TDS 5104 B Oscilloscope	Tektronix	TDS 5104 B	Oscilloscope	-
145823	Sold	Agilent 34970 A Data Acquisition / Switch Unit	Agilent	34970 A	Data Acquisition / Switch Unit	-
145822	Sold	Agilent 53181 A Frequency Counter	Agilent	53181 A	Frequency Counter	-
145821		Mactronix EV 1 6800 Wafer Sorter	Mactronix	EV 1 6800	Wafer Sorter	6, 8 inch
145803		P/N: 0021-54545 Gas Box Blocker	-	P/N: 0021-54545	Gas Box Blocker	-
145802		P/N: 0021-03637 Silane Producer	-	P/N: 0021-03637	Silane Producer	-
145801		P/N: 0100-00396 Analog I/O Board	-	P/N: 0100-00396	Analog I/O Board	-
145800		P/N: 0100-01321 VME Digital I/O Board	-	P/N: 0100-01321	VME Digital I/O Board	-
145799		P/N: 0100-38116 Interlock Assy	-	P/N: 0100-38116	Interlock Assy	-
145798		P/N: 0190-35208 PCB Chamber Interface	-	P/N: 0190-35208	PCB Chamber Interface	-
145797		P/N: 0100-35065 PCB Serial Isolator	-	P/N: 0100-35065	PCB Serial Isolator	-
145796		P/N: 0010-08185 Laser	-	P/N: 0010-08185	Laser	-
145795		P/N: 0090-03823 Wafer Present Sensor	-	P/N: 0090-03823	Wafer Present Sensor	-
145794		P/N: 0200-01668 Laser Filter	-	P/N: 0200-01668	Laser Filter	-
145809	Sold	Keithley 2400 Source Meter	Keithley	2400	Source Meter	-
145793		P/N: 0840-01016 Diode Photocell	-	P/N: 0840-01016	Diode Photocell	-
145807		TEST Apple TEST Orange TEST Banana	TEST Apple	TEST Orange	TEST Banana	-
145792		P/N: 0200-06000 Blade	-	P/N: 0200-06000	Blade	-
145791		P/N: 3870-06706 Vacuum Gate Valve	-	P/N: 3870-06706	Vacuum Gate Valve	-
145790		P/N: 0090-09166 ESC Assembly (Electrostatic Chuck)	-	P/N: 0090-09166	ESC Assembly (Electrostatic Chuck)	-
145789		P/N: 0010-09823 Vessel	-	P/N: 0010-09823	Vessel	-
145781		Accretech / TSK PG 300 RM Back Grinder	Accretech / TSK	PG 300 RM	Back Grinder	-
145786		LTX / Credence ASL 1000 Tester	LTX / Credence	ASL 1000	Tester	-
145785		KLA 2139 Brightfield Inspection	KLA	2139	Brightfield Inspection	-
145784		LTX / Credence ASL 1000 Tester	LTX / Credence	ASL 1000	Tester	-
145782		KLA / Leica INS 3300 Wafer Changer Encoder	KLA / Leica	INS 3300	Wafer Changer Encoder	-
145779		Oxford OpAL ALD (Atomic Layer Deposition)	Oxford	OpAL	ALD (Atomic Layer Deposition)	-
84514		Precitech Nanoform 350 Ultra-Precision Diamond Turning Machine	Precitech	Nanoform 350	Ultra-Precision Diamond Turning Machine	-
145774		KLA Surfscan SP 1 DLS Particle Defect System	KLA	Surfscan SP 1 DLS	Particle Defect System	12 inch
145770	Sold	Thermotron ATS 195 V 5-5 LN 2	Thermotron	ATS 195 V 5-5 LN 2	-	-
145764		Applied Materials P/N: 3620-01146 Pump Cryo Compressor	Applied Materials	P/N: 3620-01146	Pump Cryo Compressor	-
145763		Applied Materials P/N: 0040-53725 Cathode Facility Plate	Applied Materials	P/N: 0040-53725	Cathode Facility Plate	-
145761		Applied Materials P/N: 0010-22569 Feedthrough Source	Applied Materials	P/N: 0010-22569	Feedthrough Source	-
145760		Applied Materials P/N: 0040-81158 Chamber Conductor Etch	Applied Materials	P/N: 0040-81158	Chamber Conductor Etch	12 inch
145759		KLA Surfscan SP 1 TBI Particle Defect System	KLA	Surfscan SP 1 TBI	Particle Defect System	-
145757		KLA Surfscan 4500 Particle Defect System	KLA	Surfscan 4500	Particle Defect System	-
145754		Axcelis / Varian P/N: GST-C 1344	Axcelis / Varian	P/N: GST-C 1344	-	-
145742		Keithley S 680 Parametric Test System	Keithley	S 680	Parametric Test System	-
145727		TEST Parent Make TEST Parent Model TEST Parent Type	TEST Parent Make	TEST Parent Model	TEST Parent Type	-
145722		Accretech / TSK UF 200 F Prober	Accretech / TSK	UF 200 F	Prober	8 inch
145718		Thermo Fisher Scientific / FEI Nova NanoSEM 200 SEM (Scanning Electron Microscope)	Thermo Fisher Scientific / FEI	Nova NanoSEM 200	SEM (Scanning Electron Microscope)	-
145712		SUSS ACS 200 Coater / Developer	SUSS	ACS 200	Coater / Developer	8 inch
145711		Teradyne Gen 5 Board	Teradyne	Gen 5	Board	-
145709		Teradyne Zeta RF Board	Teradyne	Zeta	RF Board	-
145706		Disco DTU 162 Chiller	Disco	DTU 162	Chiller	-
145703		Accretech / TSK FP 3000 Prober	Accretech / TSK	FP 3000	Prober	-
145692	Sold	Nikon NSR 2005 i 9 C i-Line Stepper	Nikon	NSR 2005 i 9 C	i-Line Stepper	6 inch

Equipment Selection to Meet Your Needs

Agilent 34970 A Data Acquisition / Switch Unit

Tektronix TDS 5104 B Oscilloscope

Agilent 34970 A Data Acquisition / Switch Unit

Agilent 53181 A Frequency Counter

Mactronix EV 1 6800 Wafer Sorter

P/N: 0021-54545 Gas Box Blocker

P/N: 0021-03637 Silane Producer

P/N: 0100-00396 Analog I/O Board

P/N: 0100-01321 VME Digital I/O Board

P/N: 0100-38116 Interlock Assy

P/N: 0190-35208 PCB Chamber Interface

P/N: 0100-35065 PCB Serial Isolator

P/N: 0010-08185 Laser

P/N: 0090-03823 Wafer Present Sensor

P/N: 0200-01668 Laser Filter

Keithley 2400 Source Meter

P/N: 0840-01016 Diode Photocell

TEST Apple TEST Orange TEST Banana

P/N: 0200-06000 Blade

P/N: 3870-06706 Vacuum Gate Valve

P/N: 0090-09166 ESC Assembly (Electrostatic Chuck)

P/N: 0010-09823 Vessel

Accretech / TSK PG 300 RM Back Grinder

LTX / Credence ASL 1000 Tester

KLA 2139 Brightfield Inspection

LTX / Credence ASL 1000 Tester

KLA / Leica INS 3300 Wafer Changer Encoder

Oxford OpAL ALD (Atomic Layer Deposition)

Precitech Nanoform 350 Ultra-Precision Diamond Turning Machine

KLA Surfscan SP 1 DLS Particle Defect System

Thermotron ATS 195 V 5-5 LN 2

Applied Materials P/N: 3620-01146 Pump Cryo Compressor

Applied Materials P/N: 0040-53725 Cathode Facility Plate

Applied Materials P/N: 0010-22569 Feedthrough Source

Applied Materials P/N: 0040-81158 Chamber Conductor Etch

KLA Surfscan SP 1 TBI Particle Defect System

KLA Surfscan 4500 Particle Defect System

Axcelis / Varian P/N: GST-C 1344

Keithley S 680 Parametric Test System

TEST Parent Make TEST Parent Model TEST Parent Type

Accretech / TSK UF 200 F Prober

Thermo Fisher Scientific / FEI Nova NanoSEM 200 SEM (Scanning Electron Microscope)

SUSS ACS 200 Coater / Developer

Teradyne Gen 5 Board

Teradyne Zeta RF Board

Disco DTU 162 Chiller

Accretech / TSK FP 3000 Prober

Nikon NSR 2005 i 9 C i-Line Stepper

Agilent 34970 A Data Acquisition / Switch Unit

Tektronix TDS 5104 B Oscilloscope

Agilent 34970 A Data Acquisition / Switch Unit

Agilent 53181 A Frequency Counter

Mactronix EV 1 6800 Wafer Sorter

P/N: 0021-54545 Gas Box Blocker

P/N: 0021-03637 Silane Producer

P/N: 0100-00396 Analog I/O Board

P/N: 0100-01321 VME Digital I/O Board

P/N: 0100-38116 Interlock Assy

P/N: 0190-35208 PCB Chamber Interface

P/N: 0100-35065 PCB Serial Isolator

P/N: 0010-08185 Laser

P/N: 0090-03823 Wafer Present Sensor

P/N: 0200-01668 Laser Filter

Keithley 2400 Source Meter

P/N: 0840-01016 Diode Photocell

TEST Apple TEST Orange TEST Banana

P/N: 0200-06000 Blade

P/N: 3870-06706 Vacuum Gate Valve

P/N: 0090-09166 ESC Assembly (Electrostatic Chuck)

P/N: 0010-09823 Vessel

Accretech / TSK PG 300 RM Back Grinder

LTX / Credence ASL 1000 Tester

KLA 2139 Brightfield Inspection

LTX / Credence ASL 1000 Tester

KLA / Leica INS 3300 Wafer Changer Encoder

Oxford OpAL ALD (Atomic Layer Deposition)

Precitech Nanoform 350 Ultra-Precision Diamond Turning Machine

KLA Surfscan SP 1 DLS Particle Defect System

Thermotron ATS 195 V 5-5 LN 2