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KLA Candela 8720 Surface Defect Inspection System
KLA Candela 8720 Surface Defect Inspection System
KLA Candela 8720 Surface Defect Inspection System
KLA Candela 8720 Surface Defect Inspection System
KLA Candela 8720 Surface Defect Inspection System
KLA Candela 8720 Surface Defect Inspection System
KLA Candela 8720 Surface Defect Inspection System

KLA Candela 8720 Surface Defect Inspection System

Asset #: 145575

Make: KLA

Model: Candela 8720

Wafer Sizes: 2 inch

KLA Candela 8720 Surface Defect Inspection System, 2"
Optical System Unit
Laser Light Source:
- 405 nm Laser Diode
- 660 nmLaser Diode
Detection Channel:
- Scatter (Oblique, Normal)
- Specular
-Topography
- Phase
- PL (Option)
Transfer Unit
- Single Wafer Loading: Automatic Transfer by Wafer Transfer Robot
- Optical Notch Detection / Flat Detection Mode
- Wafer Thickness Detection: Laser Transmission Thickness Detection Module (DTD), Laser Diode 660 nm
Computer Unit
- CPU: XEON E5-2620 2.0 GHz, 20 MB cache
- HDD: 3TB
- Network Card: Ether Network Card
- Monitor: 19 inch LCD Monitor
- Pointing Device: Optical Trackball
Software:
- Operating System: Microsoft Windows Server 2008 Operating system (English Version)
- Candela 8720 Application Software: Version 10
Custom Specifications:
- A transformer for stepping up the power supply voltage from 200 V to 230 V
- Aligner is broken
2018 Vintage

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