English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 29899 |
|
Teradyne A 580 Tester |
Teradyne | A 580 | Tester | - |
| 29900 |
|
Semics Opus 2 Prober |
Semics | Opus 2 | Prober | - |
| 29901 |
|
Axcelis LC 6 B Belt Irradiator |
Axcelis | LC 6 B | Belt Irradiator | - |
| 29905 |
|
Varian 979 Leak Detector |
Varian | 979 | Leak Detector | - |
| 29906 |
|
Leybold UL 100 Plus Leak Detector |
Leybold | UL 100 Plus | Leak Detector | - |
| 29907 |
|
KLA / Therma-wave OP 5230 |
KLA / Therma-wave | OP 5230 | - | - |
| 29908 |
|
KLA / Therma-wave OP 3260 |
KLA / Therma-wave | OP 3260 | - | - |
| 29909 |
|
Schmid Technology TC 5 Position Dilution of Precision (PDOP) Transfer Conveyor |
Schmid Technology | TC 5 | Position Dilution of Precision (PDOP) Transfer Conveyor | - |
| 29910 |
|
Schmid Technology Position Dilution of Precision (PDOP) Phosphor Doper |
Schmid Technology | - | Position Dilution of Precision (PDOP) Phosphor Doper | - |
| 29911 |
|
Schmid Technology TC 5 BU Transfer Conveyor |
Schmid Technology | TC 5 BU | Transfer Conveyor | - |
| 29912 |
|
Schmid Technology BU 1500 / 5 / 3 Buffer |
Schmid Technology | BU 1500 / 5 / 3 | Buffer | - |
| 29913 |
|
Schmid Technology TC 5 P Etch Transfer Conveyor |
Schmid Technology | TC 5 P Etch | Transfer Conveyor | - |
| 29914 |
|
Schmid Technology P Diff Diffusion Furnace |
Schmid Technology | P Diff | Diffusion Furnace | - |
| 29915 |
|
Schmid Technology LCL 1500 Load Cell Line |
Schmid Technology | LCL 1500 | Load Cell Line | - |
| 29916 |
|
Schmid Technology TC 5 Transfer Conveyor |
Schmid Technology | TC 5 | Transfer Conveyor | - |
| 29917 |
|
Schmid Technology TC 2 BU Transfer Conveyor |
Schmid Technology | TC 2 BU | Transfer Conveyor | - |
| 29918 |
|
Schmid Technology BU 800 / 2 / 4 Buffer |
Schmid Technology | BU 800 / 2 / 4 | Buffer | - |
| 29919 |
|
Schmid Technology LTM 1500 Laser Edge Isolation |
Schmid Technology | LTM 1500 | Laser Edge Isolation | - |
| 29920 |
|
Schmid Technology C Sort 3000 Cell Sorter |
Schmid Technology | C Sort 3000 | Cell Sorter | - |
| 29921 |
|
Schmid Technology TC 2 C SORT 3000 L Transfer Conveyor |
Schmid Technology | TC 2 C SORT 3000 L | Transfer Conveyor | - |
| 29922 |
|
Schmid Technology BU 400 Buffer |
Schmid Technology | BU 400 | Buffer | - |
| 29923 |
|
Schmid Technology TC 2 BU 400 Transfer Conveyor |
Schmid Technology | TC 2 BU 400 | Transfer Conveyor | - |
| 29924 |
|
Sierratherm Position Dilution of Precision (PDOP) Diffusion Furnace |
Sierratherm | - | Position Dilution of Precision (PDOP) Diffusion Furnace | - |
| 29925 |
|
Schmid Technology AC TEX 1500 Acid Texture |
Schmid Technology | AC TEX 1500 | Acid Texture | - |
| 29926 |
|
Spectronic 20 Spectometer |
- | Spectronic 20 | Spectometer | - |
| 29927 |
|
KLA 5200 XP Overlay Measurement |
KLA | 5200 XP | Overlay Measurement | - |
| 29928 |
|
ASM iHawk Xtreme |
ASM | iHawk Xtreme | - | - |
| 29929 |
|
Tel Lithius Track |
Tel | - | Lithius Track | - |
| 29930 |
|
Bruker / Veeco Dimension X 3 D AFM (Atomic Force Microscope) |
Bruker / Veeco | Dimension X 3 D | AFM (Atomic Force Microscope) | - |
| 29931 |
|
Eco-Snow Versa Clean 1200 |
Eco-Snow | Versa Clean 1200 | - | - |
| 29932 |
|
Hitachi S 4700 II FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 II | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 29933 |
|
KLA RS 55 TCA Tool |
KLA | RS 55 TCA | Tool | 8 inch |
| 29934 |
|
KLA 2810 BF Inspection Tool |
KLA | 2810 BF | Inspection Tool | - |
| 29935 |
|
KLA Surfscan 7700 Particle Defect System |
KLA | Surfscan 7700 | Particle Defect System | - |
| 29936 |
|
Sela MC 100 Review Station |
Sela | MC 100 | Review Station | - |
| 29937 |
|
Kokusai VR 120 / 08 S Wafer Open Handler |
Kokusai | VR 120 / 08 S | Wafer Open Handler | - |
| 29938 |
|
Nikon IM 9 Autoloader |
Nikon | IM 9 | Autoloader | - |
| 29939 |
|
Hitachi S 9380 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 29940 |
|
Olympus BH 3 MJL Microscope |
Olympus | BH 3 MJL | Microscope | 6 inch |
| 29941 |
|
KLA / Therma-wave OP 3260 Thin-Film Thickness Measurement System |
KLA / Therma-wave | OP 3260 | Thin-Film Thickness Measurement System | 8 inch |
| 29942 |
|
KLA FX 200 Film Thickness Measurement System |
KLA | FX 200 | Film Thickness Measurement System | - |
| 29943 |
|
KLA P 2 Surface Profilometer |
KLA | P 2 | Surface Profilometer | 8 inch |
| 29944 |
|
KLA RS 55 Sheet Resistance Measurement |
KLA | RS 55 | Sheet Resistance Measurement | 8 inch |
| 29945 |
|
KLA / Therma-wave TP 500 Implant Dose Measurement |
KLA / Therma-wave | TP 500 | Implant Dose Measurement | 8 inch |
| 29946 |
|
KLA SFS 6220 |
KLA | SFS 6220 | - | - |
| 29947 |
|
ONTO / Nanometrics Accent Q 200 |
ONTO / Nanometrics | Accent Q 200 | - | - |
| 29948 |
|
Rigaku 3750 XRF Spectrometer (X-ray Fluorescence) |
Rigaku | 3750 | XRF Spectrometer (X-ray Fluorescence) | - |
| 29949 |
|
Olympus MX 61 F Microscope |
Olympus | MX 61 F | Microscope | 8 inch |