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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 2707 |
|
Applied Materials P 5000 CVD (Chemical Vapor Deposition) |
Applied Materials | P 5000 | CVD (Chemical Vapor Deposition) | 8 inch |
| 2708 |
|
Applied Materials SEMVision CX DR-SEM (Defect Review Scanning Electron Microscope) |
Applied Materials | SEMVision CX | DR-SEM (Defect Review Scanning Electron Microscope) | 8 inch |
| 2709 |
|
Applied Materials SEMVision CX DR-SEM (Defect Review Scanning Electron Microscope) |
Applied Materials | SEMVision CX | DR-SEM (Defect Review Scanning Electron Microscope) | 8 inch |
| 2710 |
|
Applied Materials SEMVision G 5 DR-SEM (Defect Review Scanning Electron Microscope) |
Applied Materials | SEMVision G 5 | DR-SEM (Defect Review Scanning Electron Microscope) | 12 inch |
| 2711 |
|
Applied Materials VeraSEM 3 D CD-SEM (Critical Dimension Scanning Electron Microscope) |
Applied Materials | VeraSEM 3 D | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 2712 |
|
ASM Epsilon E 2000 EPI System (Epitaxial Silicon Deposition) |
ASM | Epsilon E 2000 | EPI System (Epitaxial Silicon Deposition) | 6 inch |
| 2713 |
|
Aviza Celsior ALD (Atomic Layer Deposition) |
Aviza | Celsior | ALD (Atomic Layer Deposition) | 12 inch |
| 2714 |
|
Aviza Pantheon ALD (Atomic Layer Deposition) |
Aviza | Pantheon | ALD (Atomic Layer Deposition) | 12 inch |
| 2715 |
|
Canon MPA 600 FA Mask Aligner |
Canon | MPA 600 FA | Mask Aligner | 6 inch |
| 2716 |
|
Celerity MegaFlow VII CMP (Chemical Mechanical Polisher) |
Celerity | MegaFlow VII | CMP (Chemical Mechanical Polisher) | - |
| 2717 |
|
Comet R 2 D Ingenierie Wafer Transfer System |
Comet | R 2 D Ingenierie | Wafer Transfer System | 6 inch |
| 2718 |
|
Comet R 2 D Ingenierie Wafer Transfer System |
Comet | R 2 D Ingenierie | Wafer Transfer System | 6 inch |
| 2719 |
|
Creden ISP 3000 Inspection System |
Creden | ISP 3000 | Inspection System | - |
| 2720 |
|
Creden ISP 3000 Inspection System |
Creden | ISP 3000 | Inspection System | - |
| 2721 |
|
Nordson / Dage 2400 A Bond Pull Tester |
Nordson / Dage | 2400 A | Bond Pull Tester | - |
| 2722 |
|
SCREEN / DNS MP 2000 Single Wafer Cleaner |
SCREEN / DNS | MP 2000 | Single Wafer Cleaner | 8 inch |
| 2723 |
|
SCREEN / DNS SD W 60 A-AVP Coater / Developer |
SCREEN / DNS | SD W 60 A-AVP | Coater / Developer | 6 inch |
| 2724 |
|
SCREEN / DNS SD W 60 A-AVP Coater / Developer |
SCREEN / DNS | SD W 60 A-AVP | Coater / Developer | 6 inch |
| 2725 |
|
SCREEN / DNS SK 2000 Coater / Developer |
SCREEN / DNS | SK 2000 | Coater / Developer | 8 inch |
| 2726 |
|
Axcelis NV 6200 A Medium Current Ion Implanter |
Axcelis | NV 6200 A | Medium Current Ion Implanter | 6 inch |
| 2727 |
|
Ebara EPO 223 Tungsten CMP (Chemical Mechanical Polisher) |
Ebara | EPO 223 Tungsten | CMP (Chemical Mechanical Polisher) | 8 inch |
| 2728 |
|
Ebara EPO 223 Tungsten CMP (Chemical Mechanical Polisher) |
Ebara | EPO 223 Tungsten | CMP (Chemical Mechanical Polisher) | 8 inch |
| 2729 |
|
Ebara EPO 223 Tungsten CMP (Chemical Mechanical Polisher) |
Ebara | EPO 223 Tungsten | CMP (Chemical Mechanical Polisher) | 8 inch |
| 2730 |
|
Trikon / Electrotech ND 6200 series PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Trikon / Electrotech | ND 6200 series | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 6 inch |
| 2731 |
|
Trikon / Electrotech ND 6200 series PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Trikon / Electrotech | ND 6200 series | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 6 inch |
| 2732 |
|
Trikon / Electrotech ND 6200 series PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Trikon / Electrotech | ND 6200 series | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 6 inch |
| 2733 |
|
Trikon / Electrotech ND 6200 series PECVD (Plasma-Enhanced Chemical Vapor Deposition) |
Trikon / Electrotech | ND 6200 series | PECVD (Plasma-Enhanced Chemical Vapor Deposition) | 6 inch |
| 2734 |
|
Fico AMS 24 Molding System |
Fico | AMS 24 | Molding System | - |
| 2735 |
|
FSI Antares CX 200 Single Wafer CryoKinetic Cleaning System |
FSI | Antares CX 200 | Single Wafer CryoKinetic Cleaning System | 8 inch |
| 2736 |
|
FSI Antares CX 200 Single Wafer CryoKinetic Cleaning System |
FSI | Antares CX 200 | Single Wafer CryoKinetic Cleaning System | 8 inch |
| 2737 |
|
Lam / Novellus / Gasonics 3500 PEP series Asher / Stripper |
Lam / Novellus / Gasonics | 3500 PEP series | Asher / Stripper | 8 inch |
| 2738 |
|
Lam / Novellus / Gasonics PEP Iridia Asher / Stripper |
Lam / Novellus / Gasonics | PEP Iridia | Asher / Stripper | 8 inch |
| 2739 |
|
Lam / Novellus / Gasonics PEP Iridia Asher / Stripper |
Lam / Novellus / Gasonics | PEP Iridia | Asher / Stripper | 8 inch |
| 2740 |
|
Lam / Novellus / Gasonics PEP Iridia Asher / Stripper |
Lam / Novellus / Gasonics | PEP Iridia | Asher / Stripper | 8 inch |
| 2741 |
|
Lam / Novellus / Gasonics PEP Iridia Asher / Stripper |
Lam / Novellus / Gasonics | PEP Iridia | Asher / Stripper | 8 inch |
| 2742 |
|
Lam / Novellus / Gasonics PEP Iridia Asher / Stripper |
Lam / Novellus / Gasonics | PEP Iridia | Asher / Stripper | 8 inch |
| 2743 |
|
GSI Lumonics M 310 Laser Repair System |
GSI Lumonics | M 310 | Laser Repair System | - |
| 2744 |
|
GSI Lumonics M 310 Laser Repair System |
GSI Lumonics | M 310 | Laser Repair System | - |
| 2745 |
|
GSI Lumonics M 310 Laser Repair System |
GSI Lumonics | M 310 | Laser Repair System | - |
| 2746 |
|
Hitachi S 5000 SEM (Scanning Electron Microscope) |
Hitachi | S 5000 | SEM (Scanning Electron Microscope) | 8 inch |
| 2747 |
|
Hitachi WA 1350 Surface Profilometer |
Hitachi | WA 1350 | Surface Profilometer | 12 inch |
| 2748 |
|
Incal Technology i 9470 Burn-In Tester |
Incal Technology | i 9470 | Burn-In Tester | - |
| 2749 |
|
JEL Cyclone Plus Metal CVD (Chemical Vapor Deposition) |
JEL | Cyclone Plus | Metal CVD (Chemical Vapor Deposition) | 12 inch |
| 2750 |
|
JEL Cyclone Plus Metal CVD (Chemical Vapor Deposition) |
JEL | Cyclone Plus | Metal CVD (Chemical Vapor Deposition) | 12 inch |
| 2751 |
|
Jeol JWS 3000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Jeol | JWS 3000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 2752 |
|
Jeol JWS 3000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Jeol | JWS 3000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 2753 |
|
Bruker / Jordan Valley JVX 6200 Thin Film Measurement System |
Bruker / Jordan Valley | JVX 6200 | Thin Film Measurement System | 12 inch |
| 2754 |
|
KLA 2135 Brightfield Inspection |
KLA | 2135 | Brightfield Inspection | 8 inch |