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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
25001 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 10211 |
|
Lam / Novellus / Gasonics PEP 3510 A Asher |
Lam / Novellus / Gasonics | PEP 3510 A | Asher | 8 inch |
| 10212 |
|
Hirayama PC 304 R 7 PCT System |
Hirayama | PC 304 R 7 | PCT System | 8 inch |
| 10213 |
|
Hitachi CG 4000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10214 |
|
Hitachi IS 2700 Defect Inspection |
Hitachi | IS 2700 | Defect Inspection | 12 inch |
| 10215 |
|
Hitachi RS 3000 SEM Review (Scanning Electron Microscope) |
Hitachi | RS 3000 | SEM Review (Scanning Electron Microscope) | 8, 12 inch |
| 10216 |
|
Hitachi RS 3000 T SEM Review (Scanning Electron Microscope) |
Hitachi | RS 3000 T | SEM Review (Scanning Electron Microscope) | 12 inch |
| 10217 |
|
Hitachi RS 4000 SEM (Scanning Electron Microscope) |
Hitachi | RS 4000 | SEM (Scanning Electron Microscope) | 12 inch |
| 10218 |
|
Hitachi S 4700 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 | FE-SEM (Field Emission Scanning Electron Microscope) | 12 inch |
| 10219 |
|
Hitachi S 5200 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5200 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 10220 |
|
Hitachi S 8640 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8640 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6 inch |
| 10221 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 5 inch |
| 10222 |
|
Hitachi S 9200 S CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9200 S | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 10223 |
|
Hitachi S 9200 S CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9200 S | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 10224 |
|
Hitachi S 9200 S CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9200 S | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 10225 |
|
Hitachi S 9220 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9220 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 10226 |
|
Hitachi S 9300 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9300 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10227 |
|
Hitachi S 9300 T CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9300 T | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10228 |
|
Hitachi S 9360 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9360 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10229 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10230 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10231 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | 12 inch |
| 10232 |
|
Hitachi VR 120 SD Resistivity Measurement |
Hitachi | VR 120 SD | Resistivity Measurement | 12 inch |
| 10233 |
|
HMR BOE etch bench Wet Processing System |
HMR | BOE etch bench | Wet Processing System | 6 inch |
| 10234 |
|
Horiba PR PD 2 Reticle Mask Particle Detection System |
Horiba | PR PD 2 | Reticle Mask Particle Detection System | 6 inch |
| 10235 |
|
Horiba PR PD 2 Reticle Mask Particle Detection System |
Horiba | PR PD 2 | Reticle Mask Particle Detection System | 6 inch |
| 10236 |
|
Hugle CRD-1000 Auto Cassette Cleaner |
Hugle | CRD-1000 | Auto Cassette Cleaner | 6 inch |
| 10237 |
|
Hugle CRD-1000 Auto Cassette Cleaner |
Hugle | CRD-1000 | Auto Cassette Cleaner | 6 inch |
| 10238 |
|
Hypervision Chip Unzip System |
Hypervision | - | Chip Unzip System | 8 inch |
| 10239 |
|
Inspex Eagle 202 Patterned Wafer Inspection |
Inspex | Eagle 202 | Patterned Wafer Inspection | - |
| 10240 |
|
Inspex Eagle 202 Patterned Wafer Inspection |
Inspex | Eagle 202 | Patterned Wafer Inspection | - |
| 10241 |
|
Kaijo RT 623 A Wet Station |
Kaijo | RT 623 A | Wet Station | 6 inch |
| 10242 |
|
SUSS MA 150 Mask Aligner |
SUSS | MA 150 | Mask Aligner | 6 inch |
| 10243 |
|
SUSS MA 150 Mask Aligner |
SUSS | MA 150 | Mask Aligner | 6 inch |
| 10244 |
|
KLA / Leica INS 3300 G 1 Optical Review System |
KLA / Leica | INS 3300 G 1 | Optical Review System | 12 inch |
| 10245 |
|
KLA / Leica LDS 3300 M Macro Inspection System |
KLA / Leica | LDS 3300 M | Macro Inspection System | 12 inch |
| 10246 |
|
KLA 7700 Wafer Inspection |
KLA | 7700 | Wafer Inspection | 5 inch |
| 10247 |
|
KLA AIT I Darkfield Inspection |
KLA | AIT I | Darkfield Inspection | 6 inch |
| 10248 |
|
KLA AIT XP Darkfield Inspection |
KLA | AIT XP | Darkfield Inspection | 8 inch |
| 10249 |
|
KLA AIT XP+ Darkfield Inspection |
KLA | AIT XP+ | Darkfield Inspection | 12 inch |
| 10250 |
|
KLA AIT II Defect Inspection System |
KLA | AIT II | Defect Inspection System | 12 inch |
| 10251 |
|
KLA AIT UV Inspection System |
KLA | AIT UV | Inspection System | 8 inch |
| 10252 |
|
KLA AIT XP Darkfield Inspection |
KLA | AIT XP | Darkfield Inspection | 8 inch |
| 10253 |
|
KLA AIT XP+ Darkfield Inspection |
KLA | AIT XP+ | Darkfield Inspection | 12 inch |
| 10254 |
|
KLA Archer 10 XT Overlay System |
KLA | Archer 10 XT | Overlay System | 12 inch |
| 10255 |
|
KLA Archer AIM Overlay System |
KLA | Archer AIM | Overlay System | 12 inch |
| 10256 |
|
KLA Archer AIM+ Overlay System |
KLA | Archer AIM+ | Overlay System | 12 inch |
| 10257 |
|
KLA Archer AIM+ Overlay System |
KLA | Archer AIM+ | Overlay System | 12 inch |
| 10258 |
|
KLA 2133 Brightfield Inspection |
KLA | 2133 | Brightfield Inspection | 6 inch |