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Equipment Selection to Meet Your Needs
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of Semiconductor Manufacturing Solutions
68533 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 2129 |
|
ONTO / Rudolph NIR 3 Ellipsometer |
ONTO / Rudolph | NIR 3 | Ellipsometer | 8 inch |
| 2130 |
|
Gaertner L 115 C |
Gaertner | L 115 C | - | 6 inch |
| 2131 |
|
Applied Materials Vera 3D SEM (Scanning Electron Microscope) |
Applied Materials | Vera | 3D SEM (Scanning Electron Microscope) | 8 inch |
| 2132 |
|
Applied Materials Vera 3D SEM (Scanning Electron Microscope) |
Applied Materials | Vera | 3D SEM (Scanning Electron Microscope) | 8 inch |
| 2133 |
|
SCREEN / DNS LAW-820 Infrared Ray Lamp Anneal Machine |
SCREEN / DNS | LAW-820 | Infrared Ray Lamp Anneal Machine | 6 inch |
| 2134 |
|
SCREEN / DNS LAW-815 A Infrared Ray Lamp Anneal Machine |
SCREEN / DNS | LAW-815 A | Infrared Ray Lamp Anneal Machine | 6 inch |
| 2135 |
|
SCREEN / DNS LAW-815 A Infrared Ray Lamp Anneal Machine |
SCREEN / DNS | LAW-815 A | Infrared Ray Lamp Anneal Machine | 6 inch |
| 2136 |
|
SCREEN / DNS LAW-815 A Infrared Ray Lamp Anneal Machine |
SCREEN / DNS | LAW-815 A | Infrared Ray Lamp Anneal Machine | 6 inch |
| 2137 |
|
SCREEN / DNS LAW-820 Infrared Ray Lamp Anneal Machine |
SCREEN / DNS | LAW-820 | Infrared Ray Lamp Anneal Machine | 6 inch |
| 2138 |
|
SCREEN / DNS Oven |
SCREEN / DNS | - | Oven | 6 inch |
| 2139 |
|
Semitool ST 470 S/L SRD (Spin Rinse Dryer) |
Semitool | ST 470 S/L | SRD (Spin Rinse Dryer) | 6 inch |
| 2140 |
|
Nidec SD103 |
Nidec | SD103 | - | - |
| 2141 |
|
Axcelis 200 PCU Photoresist Stabilizer |
Axcelis | 200 PCU | Photoresist Stabilizer | 8 inch |
| 2151 |
|
KLA 2135 Brightfield Inspection |
KLA | 2135 | Brightfield Inspection | 6, 8 inch |
| 2152 |
|
KLA 2139 Brightfield Inspection |
KLA | 2139 | Brightfield Inspection | 8 inch |
| 2153 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 2154 |
|
KLA P 15 Surface Profilometer |
KLA | P 15 | Surface Profilometer | 4, 5, 6, 8 inch |
| 2155 |
|
KLA Surfscan 6200 Particle Defect System |
KLA | Surfscan 6200 | Particle Defect System | 4, 5, 6, 8 inch |
| 2156 |
|
KLA Surfscan 6200 Particle Defect System |
KLA | Surfscan 6200 | Particle Defect System | 4, 5, 6, 8 inch |
| 2157 |
|
KLA FLX 2320 S Thin Film Stress Measurement |
KLA | FLX 2320 S | Thin Film Stress Measurement | - |