68550 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 153228 |
|
ONTO / Nanometrics NanoSpec 8000 X Film Thickness Measurement System |
ONTO / Nanometrics | NanoSpec 8000 X | Film Thickness Measurement System | 6 inch |
| 153229 |
|
ONTO / Nanometrics RPMBlue FS Mass Spectrometer |
ONTO / Nanometrics | RPMBlue FS | Mass Spectrometer | 12 inch |
| 153230 |
|
ONTO / Nanometrics / Accent / Bio-Rad Atlas III Critical Dimension (CD) Measurement |
ONTO / Nanometrics / Accent / Bio-Rad | Atlas III | Critical Dimension (CD) Measurement | 12 inch |
| 153231 |
|
ONTO / Nanometrics / Accent / Bio-Rad Atlas XP Film Thickness Measurement System |
ONTO / Nanometrics / Accent / Bio-Rad | Atlas XP | Film Thickness Measurement System | 12 inch |
| 153232 |
|
ONTO / Rudolph AXI 935 Macro Defect |
ONTO / Rudolph | AXI 935 | Macro Defect | 12 inch |
| 153233 |
|
ONTO / Rudolph Ultra II Ellipsometer |
ONTO / Rudolph | Ultra II | Ellipsometer | 12 inch |
| 153234 |
|
ONTO / Rudolph Waferscan 8000 Macro Defect |
ONTO / Rudolph | Waferscan 8000 | Macro Defect | 8 inch |
| 153235 |
|
ONTO / Rudolph / August CV 9800 Wafer Carrier Inspection |
ONTO / Rudolph / August | CV 9800 | Wafer Carrier Inspection | 8 inch |
| 153236 |
|
ONTO / Rudolph / August NSX 105 Spare Parts |
ONTO / Rudolph / August | NSX 105 | Spare Parts | 8 inch |
| 153237 |
|
ONTO / Rudolph / August NSX 220 Macro Defect |
ONTO / Rudolph / August | NSX 220 | Macro Defect | 6 inch |
| 153238 |
|
Ontrak DSS 200 Series II Wafer Scrubber |
Ontrak | DSS 200 Series II | Wafer Scrubber | 6 inch |
| 153239 |
|
PSK Surpa N Asher / Stripper |
PSK | Surpa N | Asher / Stripper | 12 inch |
| 153240 |
|
Pentagon QIII Max Clean Room Particle Counter |
Pentagon | QIII Max | Clean Room Particle Counter | 8 inch |
| 153241 |
|
Perkin Elmer 4400 PVD (Physical Vapor Deposition) |
Perkin Elmer | 4400 | PVD (Physical Vapor Deposition) | 6 inch |
| 153242 |
|
Plasmatherm 790 Multi-Process Etch |
Plasmatherm | 790 | Multi-Process Etch | 6 inch |
| 153243 |
|
PST 1001191 A 01 Wafer Sorter |
PST | 1001191 A 01 | Wafer Sorter | 8 inch |
| 153244 |
|
PST DP 2150 SI Wafer Sorter |
PST | DP 2150 SI | Wafer Sorter | 8 inch |
| 153245 |
|
Quincy 30 GC Environmental Chamber |
Quincy | 30 GC | Environmental Chamber | 6 inch |
| 153246 |
|
Rame Hart 100 00 115 Drop Shape Analyzer Contact Angle Goniometer (CAG) |
Rame Hart | 100 00 115 | Drop Shape Analyzer Contact Angle Goniometer (CAG) | 8 inch |
| 153247 |
|
Raytex RXW 1227 EdgeScan |
Raytex | RXW 1227 EdgeScan | - | 12 inch |
English
Chinese (Traditional)
French
German
Japanese
Korean