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68573 products

Asset # Image Title Make Model Type Wafer Size
151935 Image coming soon

Nakamura-Tome GSP 60 SGP Grinder

Nakamura-Tome GSP 60 SGP Grinder -
151936 Nakamura-Tome GSP 60 Automatic Milling Machine

Nakamura-Tome GSP 60 Automatic Milling Machine

Nakamura-Tome GSP 60 Automatic Milling Machine -
151937 Kyoritsu GNH 2 80 PAS Milling Machine

Kyoritsu GNH 2 80 PAS Milling Machine

Kyoritsu GNH 2 80 PAS Milling Machine -
151938 Hwan Woong Centering Machine

Hwan Woong Centering Machine

Hwan Woong - Centering Machine -
151946 KLA Candela 8520 Wafer Inspection System

KLA Candela 8520 Wafer Inspection System

KLA Candela 8520 Wafer Inspection System 6 inch
151947 Image coming soon

Nikon Optistation 3100 Wafer Inspection System

Nikon Optistation 3100 Wafer Inspection System -
151950 TechWing TW 350 H Memory Test Handler

TechWing TW 350 H Memory Test Handler

TechWing TW 350 H Memory Test Handler -
151951 Advantest T 5588 Tester

Advantest T 5588 Tester

Advantest T 5588 Tester -
151954 SUSS MA 6 Mask Aligner

SUSS MA 6 Mask Aligner

SUSS MA 6 Mask Aligner -
151965 KLA P 22 Surface Profilometer

KLA P 22 Surface Profilometer

KLA P 22 Surface Profilometer -
151966 Applied Materials Centura AP Ultima X HDP-CVD (High-Density Plasma - Chemical Vapor Deposition)

Applied Materials Centura AP Ultima X HDP-CVD (High-Density Plasma - Chemical Vapor Deposition)

Applied Materials Centura AP Ultima X HDP-CVD (High-Density Plasma - Chemical Vapor Deposition) 12 inch
151963 KLA Surfscan SP 1 TBI

KLA Surfscan SP 1 TBI

KLA Surfscan SP 1 TBI - 12 inch
151964 ONTO / Nanometrics Nanospec 9200 Automated Film Analysis System

ONTO / Nanometrics Nanospec 9200 Automated Film Analysis System

ONTO / Nanometrics Nanospec 9200 Automated Film Analysis System -
151968 Image coming soon

Thermo Fisher Scientific / FEI Helios 450 HP

Thermo Fisher Scientific / FEI Helios 450 HP - -
151969 Thermo Fisher Scientific / FEI Helios 460 F 1 Dual Beam FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)

Thermo Fisher Scientific / FEI Helios 460 F 1 Dual Beam FIB-SEM (Focused Ion Beam - Scanning Electron Microscope)

Thermo Fisher Scientific / FEI Helios 460 F 1 Dual Beam FIB-SEM (Focused Ion Beam - Scanning Electron Microscope) -
151961 KLA Flexus 5410 Measurement System

KLA Flexus 5410 Measurement System

KLA Flexus 5410 Measurement System -
151962 ONTO / Nanometrics Nanospec 6100

ONTO / Nanometrics Nanospec 6100

ONTO / Nanometrics Nanospec 6100 - -
151958 KLA RS 75 TCA Resistivity System

KLA RS 75 TCA Resistivity System

KLA RS 75 TCA Resistivity System -
151970 Image coming soon

Thermo Fisher Scientific / FEI Verios 460 L

Thermo Fisher Scientific / FEI Verios 460 L - -
151959 KLA RS 55 TCA

KLA RS 55 TCA

KLA RS 55 TCA - -

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