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Equipment Selection to Meet Your Needs
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67930 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 300 |
|
Applied Materials Axiom Decoupled Plasma Source (DPS) Dry Etcher Chamber |
Applied Materials | Axiom | Decoupled Plasma Source (DPS) Dry Etcher Chamber | 12 inch |
| 301 |
|
Lam Etch PR Strip Chamber |
Lam | - | Etch PR Strip Chamber | 8 inch |
| 302 |
|
Lam Etch PR Strip Chamber |
Lam | - | Etch PR Strip Chamber | 8 inch |
| 303 |
|
Lam Etch PR Strip Chamber |
Lam | - | Etch PR Strip Chamber | 8 inch |
| 304 |
|
Lam 2300 STAR Dry Etcher |
Lam | 2300 STAR | Dry Etcher | 8 inch |
| 305 |
|
Lam STAR Chamber |
Lam | STAR | Chamber | - |
| 306 |
|
Lam Extrima 3100 Dry Etcher |
Lam | Extrima 3100 | Dry Etcher | - |
| 307 |
|
Applied Materials Centura 5200 EMxP+ |
Applied Materials | Centura 5200 | EMxP+ | 8 inch |
| 463 |
|
KLA / Therma-wave OP 2600 |
KLA / Therma-wave | OP 2600 | - | 8 inch |
| 464 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 465 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 466 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 467 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 468 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 469 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 470 |
|
KLA / Leica INS 3000 Optical Inspection Station |
KLA / Leica | INS 3000 | Optical Inspection Station | 8 inch |
| 471 |
|
LG Semicon CLS 9002 Optical Inspection Machine |
LG Semicon | CLS 9002 | Optical Inspection Machine | - |
| 472 |
|
Mosaid MS 4205 EX Bench Memory Tester |
Mosaid | MS 4205 | EX Bench Memory Tester | - |
| 473 |
|
ONTO / Nanometrics 9-7200-0195 E Mask / Wafer Inspection |
ONTO / Nanometrics | 9-7200-0195 E | Mask / Wafer Inspection | 8 inch |
| 474 |
|
ONTO / Nanometrics Q 230 Overlay |
ONTO / Nanometrics | Q 230 | Overlay | 8 inch |