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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
68550 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 2953 |
|
Keysight / Agilent 4145 B Semiconductor Parameter Analyzer |
Keysight / Agilent | 4145 B | Semiconductor Parameter Analyzer | - |
| 2954 |
|
AST Peva 900 E Evaporator |
AST | Peva 900 E | Evaporator | - |
| 2955 |
|
Asyst DP 4200 SI Wafer Sorter |
Asyst | DP 4200 SI | Wafer Sorter | - |
| 2956 |
|
Asyst DP 4200 SI Wafer Sorter |
Asyst | DP 4200 SI | Wafer Sorter | - |
| 2957 |
|
Asyst DP 4200 SI Wafer Sorter |
Asyst | DP 4200 SI | Wafer Sorter | - |
| 2958 |
|
Asyst DP 4200 SI Wafer Sorter |
Asyst | DP 4200 SI | Wafer Sorter | - |
| 2959 |
|
Asyst DP 4200 SI Wafer Sorter |
Asyst | DP 4200 SI | Wafer Sorter | - |
| 2960 |
|
Buehler Ecomet 6 CMP (Chemical Mechanical Polisher) |
Buehler | Ecomet 6 | CMP (Chemical Mechanical Polisher) | - |
| 2961 |
|
ESPEC TPC 412 M Evaluation Systems |
ESPEC | TPC 412 M | Evaluation Systems | - |
| 2962 |
|
ESPEC SH 240 S 1 Evaluation Systems |
ESPEC | SH 240 S 1 | Evaluation Systems | - |
| 2963 |
|
ESPEC STH 120 Environmental Test Chamber |
ESPEC | STH 120 | Environmental Test Chamber | - |
| 2964 |
|
ESPEC STH 121 Environmental Test Chamber |
ESPEC | STH 121 | Environmental Test Chamber | - |
| 2965 |
|
Hitachi TS 1500 Laser Dust Monitor |
Hitachi | TS 1500 | Laser Dust Monitor | - |
| 2966 |
|
Japan Scientific PA 102 |
Japan Scientific | PA 102 | - | - |
| 2967 |
|
Keyence IR Type Temperature Meter |
Keyence | IR Type | Temperature Meter | - |
| 2968 |
|
KLA eV 300 E-Beam Defect Review System |
KLA | eV 300 | E-Beam Defect Review System | - |
| 2969 |
|
KLA Viper 2410 Defect Inspection |
KLA | Viper 2410 | Defect Inspection | - |
| 2970 |
|
KLA Quantox Inspection System |
KLA | Quantox | Inspection System | - |
| 2971 |
|
Kuwano DV 810 DMM (Digital Multimeter) |
Kuwano | DV 810 | DMM (Digital Multimeter) | - |
| 2972 |
|
MARUWA AQW-200-IFV-0C |
MARUWA | AQW-200-IFV-0C | - | - |