English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
884 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 67216 |
|
Hitachi S 9360 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9360 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 67362 |
|
Hitachi S 5000 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5000 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 67374 |
|
Hitachi S 4000 SEM (Scanning Electron Microscope) |
Hitachi | S 4000 | SEM (Scanning Electron Microscope) | - |
| 75881 |
Sold
|
Hitachi S 9380 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 75886 |
Sold
|
Hitachi S 8840 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8840 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 75932 |
|
Hitachi HF 5000 TEM (Transmission Electron Microscope) |
Hitachi | HF 5000 | TEM (Transmission Electron Microscope) | - |
| 76020 |
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 76188 |
Sold
|
Hitachi S 4800 II SEM (Scanning Electron Microscope) |
Hitachi | S 4800 II | SEM (Scanning Electron Microscope) | 8 inch |
| 76263 |
|
Hitachi DB 700 AC Die Bonder |
Hitachi | DB 700 AC | Die Bonder | - |
| 76264 |
|
Hitachi ES 56 L Thermal Shock Chamber |
Hitachi | ES 56 L | Thermal Shock Chamber | - |
| 76468 |
Sold
|
Hitachi S 9260 A CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9260 A | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 126072 |
|
Hitachi CG 4000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 126073 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 126074 |
Sold
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 126117 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6 inch |
| 126122 |
|
Hitachi H 7000 TEM (Transmission Electron Microscope) |
Hitachi | H 7000 | TEM (Transmission Electron Microscope) | - |
| 384 |
|
Hitachi IS 2700 SE E-Beam Inspection |
Hitachi | IS 2700 SE | E-Beam Inspection | 12 inch |
| 385 |
|
Hitachi FB 2100 FIB (Focused Ion Beam) |
Hitachi | FB 2100 | FIB (Focused Ion Beam) | - |
| 386 |
|
Hitachi S 2700 SEM (Scanning Electron Microscope) |
Hitachi | S 2700 | SEM (Scanning Electron Microscope) | - |
| 387 |
|
Hitachi S 4160 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4160 | FE-SEM (Field Emission Scanning Electron Microscope) | 6, 8 inch |