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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
849 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 131717 |
|
Hitachi P/N 595-5518 Vacuum CRT Display Control Board |
Hitachi | P/N 595-5518 | Vacuum CRT Display Control Board | - |
| 131718 |
|
Hitachi P/N SG/VA 589-5504 CRT Board |
Hitachi | P/N SG/VA 589-5504 | CRT Board | - |
| 131719 |
|
Hitachi P/N 585-5508 DC Power Supply |
Hitachi | P/N 585-5508 | DC Power Supply | - |
| 131720 |
|
Hitachi P/N 595-5512 DC Power Supply |
Hitachi | P/N 595-5512 | DC Power Supply | - |
| 131721 |
|
Hitachi P/N 595-5518 Vacuum CKT Board |
Hitachi | P/N 595-5518 | Vacuum CKT Board | - |
| 131722 |
|
Hitachi |
Hitachi | - | - | - |
| 132211 |
|
Hitachi S 7840 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 7840 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8, 6 inch |
| 132213 |
|
Hitachi S 7800 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 7800 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 8 inch |
| 132282 |
|
Hitachi Continuous Storage Device |
Hitachi | - | Continuous Storage Device | 6, 8 inch |
| 132807 |
|
Hitachi FB 2000 A FIB (Focused Ion Beam) |
Hitachi | FB 2000 A | FIB (Focused Ion Beam) | 8 inch |
| 132808 |
|
Hitachi IS 2700 Defect Inspection |
Hitachi | IS 2700 | Defect Inspection | 8 inch |
| 132809 |
|
Hitachi S 4160 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4160 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 132810 |
|
Hitachi S 4700 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 | FE-SEM (Field Emission Scanning Electron Microscope) | 6 inch |
| 132811 |
|
Hitachi S 4800 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4800 | FE-SEM (Field Emission Scanning Electron Microscope) | 12 inch |
| 132812 |
|
Hitachi S 5000 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5000 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 132813 |
|
Hitachi S 5500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 5500 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 132814 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6, 8 inch |
| 132898 |
|
Hitachi 9200 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | 9200 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 132935 |
|
Hitachi 7800 |
Hitachi | 7800 | - | - |
| 133018 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |