English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
849 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 127069 |
|
Hitachi HL 7500 M E-Beam Lithography |
Hitachi | HL 7500 M | E-Beam Lithography | - |
| 127074 |
|
Hitachi HL 7800 M E-Beam Lithography |
Hitachi | HL 7800 M | E-Beam Lithography | - |
| 127075 |
|
Hitachi HL 8000 M E-Beam Lithography |
Hitachi | HL 8000 M | E-Beam Lithography | - |
| 127076 |
|
Hitachi S 4500 |
Hitachi | S 4500 | - | - |
| 127077 |
Sold
|
Hitachi S 5200 SEM (Scanning Electron Microscope) |
Hitachi | S 5200 | SEM (Scanning Electron Microscope) | - |
| 127148 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127175 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127176 |
|
Hitachi S 8800 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8800 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127177 |
|
Hitachi S 8800 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8800 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127416 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127437 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 127438 |
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 83515 |
Sold
|
Hitachi S 8820 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8820 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6 inch |
| 83603 |
|
Hitachi LS 9000 |
Hitachi | LS 9000 | - | - |
| 83917 |
|
Hitachi AA 6650 G QA-GF Atomic Absorption Spectrophotometer |
Hitachi | AA 6650 G | QA-GF Atomic Absorption Spectrophotometer | - |
| 83918 |
|
Hitachi 7500 s QA-ICP-MS (Quality Assurance Inductively Coupled Plasma Mass Spectrometry) |
Hitachi | 7500 s | QA-ICP-MS (Quality Assurance Inductively Coupled Plasma Mass Spectrometry) | - |
| 83963 |
|
Hitachi S 4700 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 128156 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 128158 |
|
Hitachi S 9380 II CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 9380 II | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 82460 |
|
Hitachi CG 4000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |